Measurement of the beam profiles with the improved Fresnel Zone Plate monitor

We present the recent progress of the FZP (Fresnel Zone Plate) beam profile monitor constructed at KEK-ATF damping ring. This monitor is based on an X-ray imaging optics with two FZPs [1]. In this monitor, the transverse electron beam image at bending magnet is twenty-times magnified by the two FZPs and detected on an X-ray CCD camera. The expected spatial resolution is less than 1μm in R.M.S. Recently, we install the new mechanical shutter to improve time resolution of the monitor and avoid the effects of the short-term movement of beam or the monitor itself. By applying this shutter, the shutter opening time is reduced less than 1ms and the beam profile could be measured more accurately. In this paper, we report the measurement results of beam profile by the improved FZP beam profile monitor.