Abstract
Local strain analyses in a dual phase steel were performed using a digital image correlation (DIC) method in association with Ag nanodot patterning. The optimum size of the nanodots for DIC was estimated from image error analyses. The nanodot patterning sheds light on the DIC for nanoscale local strain analysis due to its many advantages, such as high productivity, large patterning area, easy control of the dot size, and, furthermore, good adhesion.
Original language | English |
---|---|
Pages (from-to) | 245-248 |
Number of pages | 4 |
Journal | Scripta Materialia |
Volume | 68 |
Issue number | 5 |
DOIs | |
Publication status | Published - 2013 Mar |
Externally published | Yes |
Keywords
- Dual phases
- Image analysis
- Local strain measurement
- Nanostructure
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
- Metals and Alloys