Abstract
A method using the microstrip line resonator is applied to measurements of the dielectric properties of a substrate and the surface resistance of a conducting strip line versus the frequency as well as the temperature. The variational expressions for the capacitance per unit length of several microstrip lines such as an inverted microstrip line and multi-layer microstrip lines are derived. The expression involves an integral along a semi-infinite interval, but the numerical integration is very easy. Effects of a buffer layer deposited on the substrate are investigated by using a multi-layer microstrip line model. The permittivity and the loss tangent of several dielectric materials are measured by the MSL and the IMSL or the multi-layer microstrip resonator. The measured surface resistance of copper and iron is also presented to show the validity of the present method. The surface resistance of a BSCCO thick film is also presented.
| Original language | English |
|---|---|
| Pages (from-to) | 1234-1240 |
| Number of pages | 7 |
| Journal | IEICE Transactions on Electronics |
| Volume | E77-C |
| Issue number | 8 |
| Publication status | Published - 1994 Aug 1 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering