Micellar growth in dilute solutions of cesium perfluorooctanoate studied by small-angle X-ray and neutron scattering

H. Iijima, T. Kato, T. Seimiya, H. Yoshida, M. Imai

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1 Citation (Scopus)

Abstract

Small-angle X-ray and neutron scattering (SAXS and SANS, respectively) have been measured in H2O solutions of cesium perfluorooctanoate (CsPFO) in the concentration range 65-500 mM (below the phase boundary between micellar and discotic nematic phases). The data have been analyzed with a double-layered ellipsoid form factor combined with the rescaled meanspherical approximation for the intermicellar structure factor. The scattering curves in the lower-concentration range are fitted well with oblate ellipsoid rather than prolate ellipsoid. Both the aggregation number and the degree of counterion binding increase with increasing surfactant concentration, which is consistent with the concentration dependences of the 133Cs and 19F NMR chemical shifts.

Original languageEnglish
Pages (from-to)61-63
Number of pages3
JournalProgress in Colloid and Polymer Science
Volume106
DOIs
Publication statusPublished - 1997

Keywords

  • Disk-like micelle
  • Fluorinated surfactant
  • Micelle
  • Small-angle scattering

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