Microscopic observation of degradation of LaNiO3 ultrathin films caused by air exposure

Yusuke Wakabayashi; Hiroki Maeda; Tsuyoshi Kimura; Osami Sakata; Enju Sakai; Hiroshi Kumigashira

doi:10.1380/ejssnt.2016.14

Microscopic observation of degradation of LaNiO₃ ultrathin films caused by air exposure

Yusuke Wakabayashi, Hiroki Maeda, Tsuyoshi Kimura, Osami Sakata, Enju Sakai, Hiroshi Kumigashira

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

Sample degradation of LaNiO₃ ultrathin films on SrTiO₃ (001) substrate caused by air exposure is examined by means of crystal truncation rod (CTR) scattering method. Although the film is conductive right after the sample deposition, long term storage makes it insulating. CTR measurements were performed on three- and four-unit cell-thick samples just after the sample deposition and after six months of storage in air. The results show that the storage induced a significant increase in the lattice spacing along the surface normal direction with keeping in-plane periodicity. Such a structural change can be caused by escaping oxygen atoms by the thermal uctuation.

Original language	English
Pages (from-to)	14-16
Number of pages	3
Journal	e-Journal of Surface Science and Nanotechnology
Volume	14
DOIs	https://doi.org/10.1380/ejssnt.2016.14
Publication status	Published - 2016 Jan 30
Externally published	Yes

Keywords

Heterojunctions
Nickel oxides
Oxidation
X-ray scattering, diffraction, and reflection

ASJC Scopus subject areas

Biotechnology
Bioengineering
Condensed Matter Physics
Mechanics of Materials
Surfaces and Interfaces
Surfaces, Coatings and Films

Access to Document

10.1380/ejssnt.2016.14

Cite this

@article{218f33dfa2574f6c91f8cc2507147982,

title = "Microscopic observation of degradation of LaNiO3 ultrathin films caused by air exposure",

abstract = "Sample degradation of LaNiO3 ultrathin films on SrTiO3 (001) substrate caused by air exposure is examined by means of crystal truncation rod (CTR) scattering method. Although the film is conductive right after the sample deposition, long term storage makes it insulating. CTR measurements were performed on three- and four-unit cell-thick samples just after the sample deposition and after six months of storage in air. The results show that the storage induced a significant increase in the lattice spacing along the surface normal direction with keeping in-plane periodicity. Such a structural change can be caused by escaping oxygen atoms by the thermal uctuation.",

keywords = "Heterojunctions, Nickel oxides, Oxidation, X-ray scattering, diffraction, and reflection",

author = "Yusuke Wakabayashi and Hiroki Maeda and Tsuyoshi Kimura and Osami Sakata and Enju Sakai and Hiroshi Kumigashira",

note = "Funding Information: This work was supported by Grants-In-Aid for Scientific Research (JSPS KAKENHI, Grant Nos. 26287080, 26105008). The synchrotron radiation experiments at the Photon Factory and the SPring-8 were performed with the approval of the Photon Factory Program Advisory Committee (Proposal No. 2014G006, 2015S2-009) and the Japan Synchrotron Radiation Research Institute (JASRI) (Proposal No. 2012B4901, 2013A4901), respectively. Publisher Copyright: {\textcopyright} 2016 The Surface Science Society of Japan.",

year = "2016",

month = jan,

day = "30",

doi = "10.1380/ejssnt.2016.14",

language = "English",

volume = "14",

pages = "14--16",

journal = "e-Journal of Surface Science and Nanotechnology",

issn = "1348-0391",

publisher = "Surface Science Society of Japan",

}

TY - JOUR

T1 - Microscopic observation of degradation of LaNiO3 ultrathin films caused by air exposure

AU - Wakabayashi, Yusuke

AU - Maeda, Hiroki

AU - Kimura, Tsuyoshi

AU - Sakata, Osami

AU - Sakai, Enju

AU - Kumigashira, Hiroshi

N1 - Funding Information: This work was supported by Grants-In-Aid for Scientific Research (JSPS KAKENHI, Grant Nos. 26287080, 26105008). The synchrotron radiation experiments at the Photon Factory and the SPring-8 were performed with the approval of the Photon Factory Program Advisory Committee (Proposal No. 2014G006, 2015S2-009) and the Japan Synchrotron Radiation Research Institute (JASRI) (Proposal No. 2012B4901, 2013A4901), respectively. Publisher Copyright: © 2016 The Surface Science Society of Japan.

PY - 2016/1/30

Y1 - 2016/1/30

N2 - Sample degradation of LaNiO3 ultrathin films on SrTiO3 (001) substrate caused by air exposure is examined by means of crystal truncation rod (CTR) scattering method. Although the film is conductive right after the sample deposition, long term storage makes it insulating. CTR measurements were performed on three- and four-unit cell-thick samples just after the sample deposition and after six months of storage in air. The results show that the storage induced a significant increase in the lattice spacing along the surface normal direction with keeping in-plane periodicity. Such a structural change can be caused by escaping oxygen atoms by the thermal uctuation.

AB - Sample degradation of LaNiO3 ultrathin films on SrTiO3 (001) substrate caused by air exposure is examined by means of crystal truncation rod (CTR) scattering method. Although the film is conductive right after the sample deposition, long term storage makes it insulating. CTR measurements were performed on three- and four-unit cell-thick samples just after the sample deposition and after six months of storage in air. The results show that the storage induced a significant increase in the lattice spacing along the surface normal direction with keeping in-plane periodicity. Such a structural change can be caused by escaping oxygen atoms by the thermal uctuation.

KW - Heterojunctions

KW - Nickel oxides

KW - Oxidation

KW - X-ray scattering, diffraction, and reflection

UR - http://www.scopus.com/inward/record.url?scp=84975883573&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84975883573&partnerID=8YFLogxK

U2 - 10.1380/ejssnt.2016.14

DO - 10.1380/ejssnt.2016.14

M3 - Article

AN - SCOPUS:84975883573

SN - 1348-0391

VL - 14

SP - 14

EP - 16

JO - e-Journal of Surface Science and Nanotechnology

JF - e-Journal of Surface Science and Nanotechnology

ER -