Microstructure analysis using visibility contrast in X-ray talbot interferometry

W. Yashiro, Y. Terui, K. Kawabata, A. Momose

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)


We formulated reduction in visibility in the x-ray Talbot interferometer by the autocorrelation function of spatial fluctuations of a wavefront caused by unresolvable micron-size structures in a sample. The experimental results for several isotropic samples were well fitted by our formula with a simple model having three parameters characterizing the wavefront fluctuations: variance, correlation length, and the Hurst exponent. The Hurst exponent is relevant to the shapes of the microstructures, while the correlation length can be interpreted to their average size. Thus our results opens a new way to analyze microstructures in a sample.

Original languageEnglish
Title of host publication10th International Conference on X-Ray Microscopy
Number of pages4
Publication statusPublished - 2010
Event10th International Conference on X-Ray Microscopy - Chicago, IL, United States
Duration: 2010 Aug 152010 Aug 20

Publication series

NameAIP Conference Proceedings
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616


Conference10th International Conference on X-Ray Microscopy
Country/TerritoryUnited States
CityChicago, IL


  • Grating
  • Interferometer
  • Talbot effect
  • X-ray phase imaging


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