Microstructure and electrical properties of lead zirconate titanate thin films deposited by excimer laser ablation

Zhan Jie Wang, Ryutaro Maeda, Masaaki Ichiki, Hiroyuki Kokawa

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)


Thin films of Pb(Zr0.52 Ti0.48)O3 (PZT) were prepared by excimer laser ablation on a Pt/Ti/SiO2/Si substrate and were crystallized by subsequent annealing at 750°C for 90 min. Crystalline phases in the PZT films were investigated by X-ray diffraction analysis. The microstructure and composition of the films were studied by transmission electron microscopy and energy dispersive X-ray spectroscopy, respectively. It is found that the films consist almost entirely of the perovskite phase, but a thin layer of the pyrochlore phase exists at the surface of the films. Electrical properties of these films were evaluated by measuring P-E hysteresis loops and dielectric constants. The remanent polarization and the coercive field of the films were 23.9μC/cm2 and 60.5 kV/cm, respectively, while the dielectric constant and loss values measured at 1 kHz were approximately 950 and 0.04, respectively. The effect of the microstructure on the electrical properties of the PZT thin films is discussed.

Original languageEnglish
Pages (from-to)5523-5527
Number of pages5
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Issue number9 B
Publication statusPublished - 2001 Sept
Externally publishedYes


  • Ceramics
  • Dielectric properties
  • Ferroelectric properties
  • Laser ablation
  • Lead zirconate titanate (PZT)
  • Microstructure

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)


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