Microstructure and magnetic properties of CoPtCr-SiO2 perpendicular recording media

Tadaaki Oikawa; Miyabi Nakamura; Hiroyuki Uwazumi; Takehito Shimatsu; Hiroaki Muraoka; Yoshihisa Nakamura

Microstructure and magnetic properties of CoPtCr-SiO₂ perpendicular recording media

Tadaaki Oikawa, Miyabi Nakamura, Hiroyuki Uwazumi, Takehito Shimatsu, Hiroaki Muraoka, Yoshihisa Nakamura

FRIS - Advanced Interdisciplinary Research Division

Research output: Contribution to journal › Conference article › peer-review

Abstract

Microstructure and magnetic properties of CoPtCr-SiO₂ perpendicular recording media were investigated. Magnetron sputtering was used to deposit CoPtCr-SiO₂ recording layer on 20 nm-thick Ru seed layer. Fine grains of 6 nm and amorphous-like grain boundaries consisting of SiO_x were observed. Coercivity of more than 4 KOe and loop squareness of more than 0.9 were obtained at the thickness of the recording layer of more than 15 nm.

Original language	English
Pages (from-to)	FQ02
Journal	Digests of the Intermag Conference
Publication status	Published - 2002
Event	2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands Duration: 2002 Apr 28 → 2002 May 2

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title = "Microstructure and magnetic properties of CoPtCr-SiO2 perpendicular recording media",

abstract = "Microstructure and magnetic properties of CoPtCr-SiO2 perpendicular recording media were investigated. Magnetron sputtering was used to deposit CoPtCr-SiO2 recording layer on 20 nm-thick Ru seed layer. Fine grains of 6 nm and amorphous-like grain boundaries consisting of SiOx were observed. Coercivity of more than 4 KOe and loop squareness of more than 0.9 were obtained at the thickness of the recording layer of more than 15 nm.",

author = "Tadaaki Oikawa and Miyabi Nakamura and Hiroyuki Uwazumi and Takehito Shimatsu and Hiroaki Muraoka and Yoshihisa Nakamura",

year = "2002",

language = "English",

pages = "FQ02",

journal = "Digests of the Intermag Conference",

issn = "0074-6843",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG ; Conference date: 28-04-2002 Through 02-05-2002",

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TY - JOUR

T1 - Microstructure and magnetic properties of CoPtCr-SiO2 perpendicular recording media

AU - Oikawa, Tadaaki

AU - Nakamura, Miyabi

AU - Uwazumi, Hiroyuki

AU - Shimatsu, Takehito

AU - Muraoka, Hiroaki

AU - Nakamura, Yoshihisa

PY - 2002

Y1 - 2002

N2 - Microstructure and magnetic properties of CoPtCr-SiO2 perpendicular recording media were investigated. Magnetron sputtering was used to deposit CoPtCr-SiO2 recording layer on 20 nm-thick Ru seed layer. Fine grains of 6 nm and amorphous-like grain boundaries consisting of SiOx were observed. Coercivity of more than 4 KOe and loop squareness of more than 0.9 were obtained at the thickness of the recording layer of more than 15 nm.

AB - Microstructure and magnetic properties of CoPtCr-SiO2 perpendicular recording media were investigated. Magnetron sputtering was used to deposit CoPtCr-SiO2 recording layer on 20 nm-thick Ru seed layer. Fine grains of 6 nm and amorphous-like grain boundaries consisting of SiOx were observed. Coercivity of more than 4 KOe and loop squareness of more than 0.9 were obtained at the thickness of the recording layer of more than 15 nm.

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UR - http://www.scopus.com/inward/citedby.url?scp=0036912957&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0036912957

SN - 0074-6843

SP - FQ02

JO - Digests of the Intermag Conference

JF - Digests of the Intermag Conference

T2 - 2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG

Y2 - 28 April 2002 through 2 May 2002

ER -

Microstructure and magnetic properties of CoPtCr-SiO₂ perpendicular recording media

Abstract

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