Microstructure and magnetic properties of CoPtCr-SiO2 perpendicular recording media were investigated. Magnetron sputtering was used to deposit CoPtCr-SiO2 recording layer on 20 nm-thick Ru seed layer. Fine grains of 6 nm and amorphous-like grain boundaries consisting of SiOx were observed. Coercivity of more than 4 KOe and loop squareness of more than 0.9 were obtained at the thickness of the recording layer of more than 15 nm.
|Digests of the Intermag Conference
|Published - 2002
|2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands
Duration: 2002 Apr 28 → 2002 May 2