Microstructure and magnetic properties of CoPtCr-SiO2 perpendicular recording media

Tadaaki Oikawa; Miyabi Nakamura; Hiroyuki Uwazumi; Takehito Shimatsu; Hiroaki Muraoka; Yoshihisa Nakamura

Microstructure and magnetic properties of CoPtCr-SiO₂ perpendicular recording media

Tadaaki Oikawa, Miyabi Nakamura, Hiroyuki Uwazumi, Takehito Shimatsu, Hiroaki Muraoka, Yoshihisa Nakamura

Research output: Contribution to journal › Conference article › peer-review

Abstract

Microstructure and magnetic properties of CoPtCr-SiO₂ perpendicular recording media were investigated. Magnetron sputtering was used to deposit CoPtCr-SiO₂ recording layer on 20 nm-thick Ru seed layer. Fine grains of 6 nm and amorphous-like grain boundaries consisting of SiO_x were observed. Coercivity of more than 4 KOe and loop squareness of more than 0.9 were obtained at the thickness of the recording layer of more than 15 nm.

Original language	English
Journal	Digests of the Intermag Conference
Publication status	Published - 2002 Dec 1
Event	2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands Duration: 2002 Apr 28 → 2002 May 2

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

@article{4701b8a881824f99a434cf0881add80e,

title = "Microstructure and magnetic properties of CoPtCr-SiO2 perpendicular recording media",

abstract = "Microstructure and magnetic properties of CoPtCr-SiO2 perpendicular recording media were investigated. Magnetron sputtering was used to deposit CoPtCr-SiO2 recording layer on 20 nm-thick Ru seed layer. Fine grains of 6 nm and amorphous-like grain boundaries consisting of SiOx were observed. Coercivity of more than 4 KOe and loop squareness of more than 0.9 were obtained at the thickness of the recording layer of more than 15 nm.",

author = "Tadaaki Oikawa and Miyabi Nakamura and Hiroyuki Uwazumi and Takehito Shimatsu and Hiroaki Muraoka and Yoshihisa Nakamura",

year = "2002",

month = dec,

day = "1",

language = "English",

journal = "Digests of the Intermag Conference",

issn = "0074-6843",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG ; Conference date: 28-04-2002 Through 02-05-2002",

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TY - JOUR

T1 - Microstructure and magnetic properties of CoPtCr-SiO2 perpendicular recording media

AU - Oikawa, Tadaaki

AU - Nakamura, Miyabi

AU - Uwazumi, Hiroyuki

AU - Shimatsu, Takehito

AU - Muraoka, Hiroaki

AU - Nakamura, Yoshihisa

PY - 2002/12/1

Y1 - 2002/12/1

N2 - Microstructure and magnetic properties of CoPtCr-SiO2 perpendicular recording media were investigated. Magnetron sputtering was used to deposit CoPtCr-SiO2 recording layer on 20 nm-thick Ru seed layer. Fine grains of 6 nm and amorphous-like grain boundaries consisting of SiOx were observed. Coercivity of more than 4 KOe and loop squareness of more than 0.9 were obtained at the thickness of the recording layer of more than 15 nm.

AB - Microstructure and magnetic properties of CoPtCr-SiO2 perpendicular recording media were investigated. Magnetron sputtering was used to deposit CoPtCr-SiO2 recording layer on 20 nm-thick Ru seed layer. Fine grains of 6 nm and amorphous-like grain boundaries consisting of SiOx were observed. Coercivity of more than 4 KOe and loop squareness of more than 0.9 were obtained at the thickness of the recording layer of more than 15 nm.

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M3 - Conference article

AN - SCOPUS:0036912957

SN - 0074-6843

JO - Digests of the Intermag Conference

JF - Digests of the Intermag Conference

T2 - 2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG

Y2 - 28 April 2002 through 2 May 2002

ER -

Microstructure and magnetic properties of CoPtCr-SiO₂ perpendicular recording media

Abstract

ASJC Scopus subject areas

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