Modeling and implementation of subthreshold characteristics of accumulation-mode MOSFETs for various SOI layer thickness and impurity concentrations

R. Kuroda, A. Teramoto, W. Cheng, S. Sugawa, T. Ohmi

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Citations (Scopus)
Original languageEnglish
Title of host publication2007 IEEE International SOI Conference Proceedings
Number of pages2
Publication statusPublished - 2007
Event2007 IEEE International Systems-on-Chip Conference, SOI - Indian Wells, CA, United States
Duration: 2007 Oct 12007 Oct 4

Publication series

NameProceedings - IEEE International SOI Conference
ISSN (Print)1078-621X


Conference2007 IEEE International Systems-on-Chip Conference, SOI
Country/TerritoryUnited States
CityIndian Wells, CA

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