Modulated structure of Bi1.8Sr2.0Rh 1.6Ox

Kunio Yubuta; Satoshi Okada; Yuzuru Miyazaki; Ichiro Terasaki; Tsuyoshi Kajitani

doi:10.4028/0-87849-410-3.818

Modulated structure of Bi_1.8Sr_2.0Rh _1.6O_x

Kunio Yubuta, Satoshi Okada, Yuzuru Miyazaki, Ichiro Terasaki, Tsuyoshi Kajitani

Research output: Contribution to journal › Article › peer-review

Abstract

We have investigated the modulated structure of the misfit-layered crystal Bi_1.8Sr_2.0Rh_1.6O_x by means of electron diffraction and high-resolution electron microscopy. This compound consists of two interpenetrating subsystems of a hexagonal RhO₂ sheet and a distorted four-layered rock-salt-type (Bi,Sr)O block. Both subsystems have common a-, c-axes and β-angles with a = 5,28 Å, c = 29.77 Å and β= 93.7°. On the other hand, the crystal structure is incommensurated parallel to the b-axes, among which b₁ = 3.07 Å for the RhO₂ sheet and b₂ = 4.88 Å for the (Bi,Sr)O block. The misfit ratio, b₁/b₂ ∼ 0.63, characterizes the structural analogue as [Bi_1.79Sr_1.98O _y]_0.63[RhO₂]. This compound has two modulation vectors, i.e., q₁ = - a* + 0.63b₁* and q ₂ = 0.17b₁* + c*, and the superspace group is assigned as the Cc( 1 β0, 0μ1)-type from the electron diffraction patterns. High-resolution images taken with the incident electron beam parallel to the a- and c-axes clearly show displacive as well as compositional modulations.

Original language	English
Pages (from-to)	818-821
Number of pages	4
Journal	Key Engineering Materials
Volume	336-338 I
DOIs	https://doi.org/10.4028/0-87849-410-3.818
Publication status	Published - 2007 Jan 1

Keywords

Electron diffraction
High-resolution image
Misfit-layered structure
Modulated structure
Superspace group

ASJC Scopus subject areas

Materials Science(all)
Mechanics of Materials
Mechanical Engineering

Access to Document

10.4028/0-87849-410-3.818

Cite this

@article{a5428b0f68fa46c2a7c7a1e8015bbd51,

title = "Modulated structure of Bi1.8Sr2.0Rh 1.6Ox",

abstract = "We have investigated the modulated structure of the misfit-layered crystal Bi1.8Sr2.0Rh1.6Ox by means of electron diffraction and high-resolution electron microscopy. This compound consists of two interpenetrating subsystems of a hexagonal RhO2 sheet and a distorted four-layered rock-salt-type (Bi,Sr)O block. Both subsystems have common a-, c-axes and β-angles with a = 5,28 {\AA}, c = 29.77 {\AA} and β= 93.7°. On the other hand, the crystal structure is incommensurated parallel to the b-axes, among which b1 = 3.07 {\AA} for the RhO2 sheet and b2 = 4.88 {\AA} for the (Bi,Sr)O block. The misfit ratio, b1/b2 ∼ 0.63, characterizes the structural analogue as [Bi1.79Sr1.98O y]0.63[RhO2]. This compound has two modulation vectors, i.e., q1 = - a* + 0.63b1* and q 2 = 0.17b1* + c*, and the superspace group is assigned as the Cc( 1 β0, 0μ1)-type from the electron diffraction patterns. High-resolution images taken with the incident electron beam parallel to the a- and c-axes clearly show displacive as well as compositional modulations.",

keywords = "Electron diffraction, High-resolution image, Misfit-layered structure, Modulated structure, Superspace group",

author = "Kunio Yubuta and Satoshi Okada and Yuzuru Miyazaki and Ichiro Terasaki and Tsuyoshi Kajitani",

year = "2007",

month = jan,

day = "1",

doi = "10.4028/0-87849-410-3.818",

language = "English",

volume = "336-338 I",

pages = "818--821",

journal = "Key Engineering Materials",

issn = "1013-9826",

publisher = "Trans Tech Publications",

}

TY - JOUR

T1 - Modulated structure of Bi1.8Sr2.0Rh 1.6Ox

AU - Yubuta, Kunio

AU - Okada, Satoshi

AU - Miyazaki, Yuzuru

AU - Terasaki, Ichiro

AU - Kajitani, Tsuyoshi

PY - 2007/1/1

Y1 - 2007/1/1

N2 - We have investigated the modulated structure of the misfit-layered crystal Bi1.8Sr2.0Rh1.6Ox by means of electron diffraction and high-resolution electron microscopy. This compound consists of two interpenetrating subsystems of a hexagonal RhO2 sheet and a distorted four-layered rock-salt-type (Bi,Sr)O block. Both subsystems have common a-, c-axes and β-angles with a = 5,28 Å, c = 29.77 Å and β= 93.7°. On the other hand, the crystal structure is incommensurated parallel to the b-axes, among which b1 = 3.07 Å for the RhO2 sheet and b2 = 4.88 Å for the (Bi,Sr)O block. The misfit ratio, b1/b2 ∼ 0.63, characterizes the structural analogue as [Bi1.79Sr1.98O y]0.63[RhO2]. This compound has two modulation vectors, i.e., q1 = - a* + 0.63b1* and q 2 = 0.17b1* + c*, and the superspace group is assigned as the Cc( 1 β0, 0μ1)-type from the electron diffraction patterns. High-resolution images taken with the incident electron beam parallel to the a- and c-axes clearly show displacive as well as compositional modulations.

AB - We have investigated the modulated structure of the misfit-layered crystal Bi1.8Sr2.0Rh1.6Ox by means of electron diffraction and high-resolution electron microscopy. This compound consists of two interpenetrating subsystems of a hexagonal RhO2 sheet and a distorted four-layered rock-salt-type (Bi,Sr)O block. Both subsystems have common a-, c-axes and β-angles with a = 5,28 Å, c = 29.77 Å and β= 93.7°. On the other hand, the crystal structure is incommensurated parallel to the b-axes, among which b1 = 3.07 Å for the RhO2 sheet and b2 = 4.88 Å for the (Bi,Sr)O block. The misfit ratio, b1/b2 ∼ 0.63, characterizes the structural analogue as [Bi1.79Sr1.98O y]0.63[RhO2]. This compound has two modulation vectors, i.e., q1 = - a* + 0.63b1* and q 2 = 0.17b1* + c*, and the superspace group is assigned as the Cc( 1 β0, 0μ1)-type from the electron diffraction patterns. High-resolution images taken with the incident electron beam parallel to the a- and c-axes clearly show displacive as well as compositional modulations.

KW - Electron diffraction

KW - High-resolution image

KW - Misfit-layered structure

KW - Modulated structure

KW - Superspace group

UR - http://www.scopus.com/inward/record.url?scp=33947256818&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33947256818&partnerID=8YFLogxK

U2 - 10.4028/0-87849-410-3.818

DO - 10.4028/0-87849-410-3.818

M3 - Article

AN - SCOPUS:33947256818

SN - 1013-9826

VL - 336-338 I

SP - 818

EP - 821

JO - Key Engineering Materials

JF - Key Engineering Materials

ER -