Monolayer nitridation of silicon surfaces by a dry chemical process using dimethylhydrazine or ammonia

Seiichi Takami, Yasuyuki Egashira, Itaru Honma, Hiroshi Komiyama

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13 Citations (Scopus)

Abstract

A hydrogen-terminated silicon surface was successfully converted to a surface covered with a monolayer of nitrogen. Nitridation was carried out in a vacuum chamber using either dimethylhydrazine [H2N-N(CH3)2] or ammonia at a pressure of 1 mTorr and at temperatures ranging from 400 to 600°C. In situ x-ray photoelectron spectroscopy measurements revealed that the binding energy and the full width at half-maximum in the nitrogen spectra are the same as those in bulk Si3N4. Nitrogen content at the surface increased as the nitridation time increased and, below 500°C, saturated at a value that approximately corresponds to a monolayer thickness. These results show the effectiveness of dry chemical processes for preparing uniform Si surfaces terminated with specific atoms or molecules other than hydrogen.

Original languageEnglish
Pages (from-to)1527
Number of pages1
JournalApplied Physics Letters
DOIs
Publication statusPublished - 1995

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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