Abstract
This paper describes an overview of the multi-axis grating encoders developed for measurement of stage motions. Two grating mirrors are employed in the grating encoders. One of the grating mirrors is utilised as the scale grating. The other grating mirror is included in the sensor head as the reference grating. The ±1st order diffracted beams from the two grating mirrors are superimposed to generate interference signals, which have information about not only the Z-directional out-of-plane displacement but also X- or Y-directional in-plane displacement. A prototype two-axis linear grating encoder with a software compensation technique for X- and Z-directional measurement, and a prototype three-axis surface grating encoder with a double Y-PD unit design for X-, Y- and Z-directional measurement are then presented.
Original language | English |
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Pages (from-to) | 409-426 |
Number of pages | 18 |
Journal | International Journal of Nanomanufacturing |
Volume | 7 |
Issue number | 5-6 |
DOIs | |
Publication status | Published - 2011 Nov |
Keywords
- Dimensional metrology
- Grating encoder
- Linear encoder
- Multi-axis displacement
- Optical sensor
- Surface encoder
ASJC Scopus subject areas
- Industrial and Manufacturing Engineering