Multiple scattering effects on X-ray photoelectron diffraction from Si(111) √3 × √3-Ag and -Sb surfaces

X. Chen, T. Abukawa, S. Kono

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)


The effects of multiple scattering (MS) on X-ray photoelectron diffraction (XPD) from Si(111),√3 × √3-Ag and -Sb (referred to as √3-Ag and -Sb) surfaces have been studied using a MS concentric-shell algorithm for sufficiently large clusters. Significant MS effects that cannot be reconciled by a kinematical treatment have been seen for the √3-Ag surface, but not for the √3-Sb surface. This indicates that previous XPD studies on the √3-Ag surface were incomplete due to the failure of single scattering theory, and explains why prior XPD studies on this surface were not successful at first in predicting a presently widely accepted model. With a reliability factor analysis for MS simulations, we have shown that the √3-Ag surface is formed in a honeycomb-chained-trimer model with its structural parameters consistent with those from other techniques.

Original languageEnglish
Pages (from-to)28-38
Number of pages11
JournalSurface Science
Issue number1-3
Publication statusPublished - 1996 Jun 10


  • Antimony
  • Electron-solid interactions, scattering, diffraction
  • Low index single crystal surfaces
  • Metal-semiconductor interfaces
  • Photoelectron diffraction
  • Silicon
  • Silver

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry


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