TY - JOUR
T1 - Nanometric edge profile measurement of cutting tools on a diamond turning machine
AU - Asai, Takemi
AU - Arai, Yoshikazu
AU - Cui, Yuguo
AU - Gao, Wei
PY - 2009
Y1 - 2009
N2 - Single crystal diamond tools are used for fabrication of precision parts[1-5]. Although there are many types of tools that are supplied, the tools with round nose are popular for machining very smooth surfaces. Tools with small nose radii, small wedge angles and included angles are also being utilized for fabrication of micro structured surfaces such as microlens arrays[6], diffractive optical elements and so on. In ultra precision machining, tools are very important as a part of the machining equipment. The roughness or profile of machined surface may become out of desired tolerance. It is thus necessary to know the state of the tool edge accurately. To meet these requirements, an atomic force microscope (AFM) for measuring the 3D edge profiles of tools having nanometer-scale cutting edge radii with high resolution has been developed [7-8]. Although the AFM probe unit is combined with an optical sensor for aligning the measurement probe with the tools edge top to be measured in short time in this system, this time only the AFM probe unit was used. During the measurement time, that was attached onto the ultra precision turning machine to confirm the possibility of profile measurement system.
AB - Single crystal diamond tools are used for fabrication of precision parts[1-5]. Although there are many types of tools that are supplied, the tools with round nose are popular for machining very smooth surfaces. Tools with small nose radii, small wedge angles and included angles are also being utilized for fabrication of micro structured surfaces such as microlens arrays[6], diffractive optical elements and so on. In ultra precision machining, tools are very important as a part of the machining equipment. The roughness or profile of machined surface may become out of desired tolerance. It is thus necessary to know the state of the tool edge accurately. To meet these requirements, an atomic force microscope (AFM) for measuring the 3D edge profiles of tools having nanometer-scale cutting edge radii with high resolution has been developed [7-8]. Although the AFM probe unit is combined with an optical sensor for aligning the measurement probe with the tools edge top to be measured in short time in this system, this time only the AFM probe unit was used. During the measurement time, that was attached onto the ultra precision turning machine to confirm the possibility of profile measurement system.
KW - Atomic force microscope (AFM)
KW - Diamond cutting tool
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U2 - 10.1117/12.807623
DO - 10.1117/12.807623
M3 - Conference article
AN - SCOPUS:62449183671
SN - 0277-786X
VL - 7133
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
M1 - 713314
T2 - 5th International Symposium on Instrumentation Science and Technology
Y2 - 15 September 2009 through 18 September 2009
ER -