Nanorheology of polymer blends investigated by atomic force microscopy

Ken Nakajima, Hideki Yamaguchi, Jeong Chang Lee, Masami Kageshima, Takayuki Ikehara, Toshio Nishi

Research output: Contribution to journalArticlepeer-review

51 Citations (Scopus)


We measured force-distance curves of polystyrene (PS)/poly (vinyl methyl ether) (PVME) blend thin films using atomic force microscopy (AFM) in order to pursue the possible usage of AFM as a tool for detecting viscoelastic properties of polymeric materials from a nanoscopic point of view. In quasi-static measurements of force-distance curves for a sample whose PS content equals 100%, both adhesive force and capillary force were measured separately. A phenomenon possibly assigned to pulling off of polymer chains by an AFM tip could also be observed for a sample whose PS content equals 60%. By changing the velocity of the AFM tip acting on a blend sample whose PS content equals 40%, we confirmed that the law of time-temperature reducibility holds even on such a nanoscopic scale. This blend sample behaved as a viscous fluid at room temperature, while its behavior became glassy when faster movements of the AFM tip were applied. A discussion on the future development of a new field of research which should be called "nanorheology" was also presented.

Original languageEnglish
Pages (from-to)3850-3854
Number of pages5
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Issue number6 SUPPL. B
Publication statusPublished - 1997 Jun
Externally publishedYes


  • Atomic force microscopy
  • Force-distance curve
  • Nanorheology
  • Polystyrene/poly (vinyl methyl ether) blend
  • Time-temperature reducibility
  • Viscoelasticity

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)


Dive into the research topics of 'Nanorheology of polymer blends investigated by atomic force microscopy'. Together they form a unique fingerprint.

Cite this