Nanorheology on polymer surface with atomic force microscopy

Hideyuki Nukaga; Mie Kaneko; So Fujinami; Hiroyuki Watabe; Ken Nakajima; Toshio Nishi

Nanorheology on polymer surface with atomic force microscopy

Hideyuki Nukaga, Mie Kaneko, So Fujinami, Hiroyuki Watabe, Ken Nakajima, Toshio Nishi

Research output: Contribution to conference › Paper › peer-review

Abstract

Our interest exists on the understanding of viscoelastic properties of polymeric surfaces by means of nanorheology atomic force microscopy (AFM). In analyzing the force curve using Hertz theories, elastic modulus was obtained with nanometer-scale resolution. Furthermore, sample deformation by the force exerted was also estimated from the force curve analyses. When PS/PIB blend samples were observed in contact-mode operation, PIB rich phases appeared as depressions. However, this was artifact caused by very small elastic modulus of PIB. We reconstructed "real height image" from original height image and sample deformation image, which was almost flat at the apparent depression. We will report its detailed procedure together with the method of obtaining elastic modulus distribution image at the site.

Original language	English
Number of pages	1
Publication status	Published - 2005 Dec 1
Event	54th SPSJ Annual Meeting 2005 - Yokohama, Japan Duration: 2005 May 25 → 2005 May 27

Other

Other	54th SPSJ Annual Meeting 2005
Country/Territory	Japan
City	Yokohama
Period	05/5/25 → 05/5/27

Keywords

Atomic Force Microscopy
Force-curve
Hertz theory
Nanorheology
Polymer Blend

ASJC Scopus subject areas

Engineering(all)

Cite this

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title = "Nanorheology on polymer surface with atomic force microscopy",

abstract = "Our interest exists on the understanding of viscoelastic properties of polymeric surfaces by means of nanorheology atomic force microscopy (AFM). In analyzing the force curve using Hertz theories, elastic modulus was obtained with nanometer-scale resolution. Furthermore, sample deformation by the force exerted was also estimated from the force curve analyses. When PS/PIB blend samples were observed in contact-mode operation, PIB rich phases appeared as depressions. However, this was artifact caused by very small elastic modulus of PIB. We reconstructed {"}real height image{"} from original height image and sample deformation image, which was almost flat at the apparent depression. We will report its detailed procedure together with the method of obtaining elastic modulus distribution image at the site.",

keywords = "Atomic Force Microscopy, Force-curve, Hertz theory, Nanorheology, Polymer Blend",

author = "Hideyuki Nukaga and Mie Kaneko and So Fujinami and Hiroyuki Watabe and Ken Nakajima and Toshio Nishi",

year = "2005",

month = dec,

day = "1",

language = "English",

note = "54th SPSJ Annual Meeting 2005 ; Conference date: 25-05-2005 Through 27-05-2005",

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TY - CONF

T1 - Nanorheology on polymer surface with atomic force microscopy

AU - Nukaga, Hideyuki

AU - Kaneko, Mie

AU - Fujinami, So

AU - Watabe, Hiroyuki

AU - Nakajima, Ken

AU - Nishi, Toshio

PY - 2005/12/1

Y1 - 2005/12/1

N2 - Our interest exists on the understanding of viscoelastic properties of polymeric surfaces by means of nanorheology atomic force microscopy (AFM). In analyzing the force curve using Hertz theories, elastic modulus was obtained with nanometer-scale resolution. Furthermore, sample deformation by the force exerted was also estimated from the force curve analyses. When PS/PIB blend samples were observed in contact-mode operation, PIB rich phases appeared as depressions. However, this was artifact caused by very small elastic modulus of PIB. We reconstructed "real height image" from original height image and sample deformation image, which was almost flat at the apparent depression. We will report its detailed procedure together with the method of obtaining elastic modulus distribution image at the site.

AB - Our interest exists on the understanding of viscoelastic properties of polymeric surfaces by means of nanorheology atomic force microscopy (AFM). In analyzing the force curve using Hertz theories, elastic modulus was obtained with nanometer-scale resolution. Furthermore, sample deformation by the force exerted was also estimated from the force curve analyses. When PS/PIB blend samples were observed in contact-mode operation, PIB rich phases appeared as depressions. However, this was artifact caused by very small elastic modulus of PIB. We reconstructed "real height image" from original height image and sample deformation image, which was almost flat at the apparent depression. We will report its detailed procedure together with the method of obtaining elastic modulus distribution image at the site.

KW - Atomic Force Microscopy

KW - Force-curve

KW - Hertz theory

KW - Nanorheology

KW - Polymer Blend

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M3 - Paper

AN - SCOPUS:28844466425

T2 - 54th SPSJ Annual Meeting 2005

Y2 - 25 May 2005 through 27 May 2005

ER -

Nanorheology on polymer surface with atomic force microscopy

Abstract

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Keywords

ASJC Scopus subject areas

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