New ADXD/EDXD spectrometer for determining the structure of melts at high temperature

Kazumasa Sugiyama; Takeshi Shinkai; Yoshio Waseda

New ADXD/EDXD spectrometer for determining the structure of melts at high temperature

Kazumasa Sugiyama, Takeshi Shinkai, Yoshio Waseda

IMR - Materials Development Division

Tohoku University

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

A new spectrometer for angular dispersive X-ray diffraction (ADXD) and energy dispersive X-ray diffraction (EDXD) facility has been built using a vertical type θ-θgoniometer, which makes possible to measure the diffraction profiles of high temperature melts over 200 mn^-1. The fundamentals of this facility were tested by obtaining the interference function of molten NaAlSi₃O₈ at 1460 K. The feasibility of the EDXD analysis for high temperature melts was also confirmed by obtaining the well resolved RDF of molten LiNbO₃ at 1550 K.

Original language	English
Pages (from-to)	231-237
Number of pages	7
Journal	Science Reports of the Rerearch Institutes Tohoku University Series A-Physics
Volume	42
Issue number	1
Publication status	Published - 1996 Mar

Keywords

ADXD
EDXD
High temperature
Melt structure
RDF
X-ray diffraction

Cite this

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abstract = "A new spectrometer for angular dispersive X-ray diffraction (ADXD) and energy dispersive X-ray diffraction (EDXD) facility has been built using a vertical type θ-θgoniometer, which makes possible to measure the diffraction profiles of high temperature melts over 200 mn-1. The fundamentals of this facility were tested by obtaining the interference function of molten NaAlSi3O8 at 1460 K. The feasibility of the EDXD analysis for high temperature melts was also confirmed by obtaining the well resolved RDF of molten LiNbO3 at 1550 K.",

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author = "Kazumasa Sugiyama and Takeshi Shinkai and Yoshio Waseda",

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AU - Shinkai, Takeshi

AU - Waseda, Yoshio

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Y1 - 1996/3

N2 - A new spectrometer for angular dispersive X-ray diffraction (ADXD) and energy dispersive X-ray diffraction (EDXD) facility has been built using a vertical type θ-θgoniometer, which makes possible to measure the diffraction profiles of high temperature melts over 200 mn-1. The fundamentals of this facility were tested by obtaining the interference function of molten NaAlSi3O8 at 1460 K. The feasibility of the EDXD analysis for high temperature melts was also confirmed by obtaining the well resolved RDF of molten LiNbO3 at 1550 K.

AB - A new spectrometer for angular dispersive X-ray diffraction (ADXD) and energy dispersive X-ray diffraction (EDXD) facility has been built using a vertical type θ-θgoniometer, which makes possible to measure the diffraction profiles of high temperature melts over 200 mn-1. The fundamentals of this facility were tested by obtaining the interference function of molten NaAlSi3O8 at 1460 K. The feasibility of the EDXD analysis for high temperature melts was also confirmed by obtaining the well resolved RDF of molten LiNbO3 at 1550 K.

KW - ADXD

KW - EDXD

KW - High temperature

KW - Melt structure

KW - RDF

KW - X-ray diffraction

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New ADXD/EDXD spectrometer for determining the structure of melts at high temperature

Abstract

Keywords

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