A new spectrometer for angular dispersive X-ray diffraction (ADXD) and energy dispersive X-ray diffraction (EDXD) facility has been built using a vertical type θ-θgoniometer, which makes possible to measure the diffraction profiles of high temperature melts over 200 mn-1. The fundamentals of this facility were tested by obtaining the interference function of molten NaAlSi3O8 at 1460 K. The feasibility of the EDXD analysis for high temperature melts was also confirmed by obtaining the well resolved RDF of molten LiNbO3 at 1550 K.
|Number of pages||7|
|Journal||Science Reports of the Rerearch Institutes Tohoku University Series A-Physics|
|Publication status||Published - 1996 Mar|
- High temperature
- Melt structure
- X-ray diffraction