New Applications in Atom Probe Tomography

D. J. Larson; V. S. Smentkowski; L. M. Gordon; D. Joester; K. Inoue; D. A. Reinhard; T. J. Prosa; D. Olson; D. Lawrence; P. H. Clifton; R. M. Ulfig; I. Martin; T. F. Kelly

doi:10.1017/S1431927612006484

New Applications in Atom Probe Tomography

D. J. Larson, V. S. Smentkowski, L. M. Gordon, D. Joester, K. Inoue, D. A. Reinhard, T. J. Prosa, D. Olson, D. Lawrence, P. H. Clifton, R. M. Ulfig, I. Martin, T. F. Kelly

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	926-927
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
DOIs	https://doi.org/10.1017/S1431927612006484
Publication status	Published - 2012 Jul
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

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10.1017/S1431927612006484

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@article{55e04b859e744715b8d912f59d9c4cd7,

title = "New Applications in Atom Probe Tomography",

author = "Larson, {D. J.} and Smentkowski, {V. S.} and Gordon, {L. M.} and D. Joester and K. Inoue and Reinhard, {D. A.} and Prosa, {T. J.} and D. Olson and D. Lawrence and Clifton, {P. H.} and Ulfig, {R. M.} and I. Martin and Kelly, {T. F.}",

year = "2012",

month = jul,

doi = "10.1017/S1431927612006484",

language = "English",

volume = "18",

pages = "926--927",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

}

TY - JOUR

T1 - New Applications in Atom Probe Tomography

AU - Larson, D. J.

AU - Smentkowski, V. S.

AU - Gordon, L. M.

AU - Joester, D.

AU - Inoue, K.

AU - Reinhard, D. A.

AU - Prosa, T. J.

AU - Olson, D.

AU - Lawrence, D.

AU - Clifton, P. H.

AU - Ulfig, R. M.

AU - Martin, I.

AU - Kelly, T. F.

PY - 2012/7

Y1 - 2012/7

UR - http://www.scopus.com/inward/record.url?scp=85008543963&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85008543963&partnerID=8YFLogxK

U2 - 10.1017/S1431927612006484

DO - 10.1017/S1431927612006484

M3 - Article

AN - SCOPUS:85008543963

SN - 1431-9276

VL - 18

SP - 926

EP - 927

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -

New Applications in Atom Probe Tomography

ASJC Scopus subject areas

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