New area detector for atomic-resolution scanning transmission electron microscopy

Naoya Shibata; Yuji Kohno; Scott D. Findlay; Hidetaka Sawada; Yukihito Kondo; Yuichi Ikuhara

doi:10.1093/jmicro/dfq014

New area detector for atomic-resolution scanning transmission electron microscopy

Naoya Shibata, Yuji Kohno, Scott D. Findlay, Hidetaka Sawada, Yukihito Kondo, Yuichi Ikuhara

Research output: Contribution to journal › Article › peer-review

96 Citations (Scopus)

Abstract

A new area detector for atomic-resolution scanning transmission electron microscopy (STEM) is developed and tested. The circular detector is divided into 16 segments which are individually optically coupled with photomultiplier tubes. Thus, 16 atomic-resolution STEM images which are sensitive to the spatial distribution of scattered electrons on the detector plane can be simultaneously obtained. This new detector can be potentially used not only for the simultaneous formation of common bright-field, low-angle annular dark-field and high-angle annular dark-field images, but also for the quantification of images by detecting the full range of scattered electrons and even for exploring novel atomic-resolution imaging modes by post-processing combination of the individual images.

Original language	English
Pages (from-to)	473-479
Number of pages	7
Journal	Journal of Electron Microscopy
Volume	59
Issue number	6
DOIs	https://doi.org/10.1093/jmicro/dfq014
Publication status	Published - 2010 Dec

Keywords

STEM
atomic-resolution imaging
detector

ASJC Scopus subject areas

Instrumentation

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10.1093/jmicro/dfq014

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title = "New area detector for atomic-resolution scanning transmission electron microscopy",

abstract = "A new area detector for atomic-resolution scanning transmission electron microscopy (STEM) is developed and tested. The circular detector is divided into 16 segments which are individually optically coupled with photomultiplier tubes. Thus, 16 atomic-resolution STEM images which are sensitive to the spatial distribution of scattered electrons on the detector plane can be simultaneously obtained. This new detector can be potentially used not only for the simultaneous formation of common bright-field, low-angle annular dark-field and high-angle annular dark-field images, but also for the quantification of images by detecting the full range of scattered electrons and even for exploring novel atomic-resolution imaging modes by post-processing combination of the individual images.",

keywords = "STEM, atomic-resolution imaging, detector",

author = "Naoya Shibata and Yuji Kohno and Findlay, {Scott D.} and Hidetaka Sawada and Yukihito Kondo and Yuichi Ikuhara",

note = "Funding Information: This work was supported by the Industrial Technology Research Grant Program in 2007 from the New Energy and Industrial Technology Development Organization (NEDO). Copyright: Copyright 2011 Elsevier B.V., All rights reserved.",

year = "2010",

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doi = "10.1093/jmicro/dfq014",

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AU - Shibata, Naoya

AU - Kohno, Yuji

AU - Findlay, Scott D.

AU - Sawada, Hidetaka

AU - Kondo, Yukihito

AU - Ikuhara, Yuichi

N1 - Funding Information: This work was supported by the Industrial Technology Research Grant Program in 2007 from the New Energy and Industrial Technology Development Organization (NEDO). Copyright: Copyright 2011 Elsevier B.V., All rights reserved.

PY - 2010/12

Y1 - 2010/12

N2 - A new area detector for atomic-resolution scanning transmission electron microscopy (STEM) is developed and tested. The circular detector is divided into 16 segments which are individually optically coupled with photomultiplier tubes. Thus, 16 atomic-resolution STEM images which are sensitive to the spatial distribution of scattered electrons on the detector plane can be simultaneously obtained. This new detector can be potentially used not only for the simultaneous formation of common bright-field, low-angle annular dark-field and high-angle annular dark-field images, but also for the quantification of images by detecting the full range of scattered electrons and even for exploring novel atomic-resolution imaging modes by post-processing combination of the individual images.

AB - A new area detector for atomic-resolution scanning transmission electron microscopy (STEM) is developed and tested. The circular detector is divided into 16 segments which are individually optically coupled with photomultiplier tubes. Thus, 16 atomic-resolution STEM images which are sensitive to the spatial distribution of scattered electrons on the detector plane can be simultaneously obtained. This new detector can be potentially used not only for the simultaneous formation of common bright-field, low-angle annular dark-field and high-angle annular dark-field images, but also for the quantification of images by detecting the full range of scattered electrons and even for exploring novel atomic-resolution imaging modes by post-processing combination of the individual images.

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KW - atomic-resolution imaging

KW - detector

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JO - Microscopy (Oxford, England)

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New area detector for atomic-resolution scanning transmission electron microscopy

Abstract

Keywords

ASJC Scopus subject areas

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