New nanoscale imaging with a simple hard X-ray nanoslit

H. Takano, T. Hashimoto, T. Tsuji, T. Koyama, Y. Tsusaka, Y. Kagoshima

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)


A simple and new procedure to measure the optimal intensity distribution of an x-ray wavefield in nanoscale resolution is proposed. A heavy-metal wire can work as a "nanoslit" with a nanoscale aperture size. Its basic function can be described simply with geometrical optics using total reflection. The further function is investigated with numerical calculation of a diffraction edge. In the experiment, Fresnel fringes generated by a rectangular aperture were measured by using a 300-μm platinum wire as the nanoslit. Its high potential use in imaging applications is discussed.

Original languageEnglish
Title of host publication10th International Conference on X-Ray Microscopy
Number of pages4
Publication statusPublished - 2010 Dec 1
Externally publishedYes
Event10th International Conference on X-Ray Microscopy - Chicago, IL, United States
Duration: 2010 Aug 152010 Aug 20

Publication series

NameAIP Conference Proceedings
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616


Other10th International Conference on X-Ray Microscopy
Country/TerritoryUnited States
CityChicago, IL


  • X-ray imaging
  • edge diffraction
  • metal wire

ASJC Scopus subject areas

  • Ecology, Evolution, Behavior and Systematics
  • Ecology
  • Plant Science
  • Physics and Astronomy(all)
  • Nature and Landscape Conservation


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