@inproceedings{3f065c39dca3476fa4c8637045fb805d,
title = "New nanoscale imaging with a simple hard X-ray nanoslit",
abstract = "A simple and new procedure to measure the optimal intensity distribution of an x-ray wavefield in nanoscale resolution is proposed. A heavy-metal wire can work as a {"}nanoslit{"} with a nanoscale aperture size. Its basic function can be described simply with geometrical optics using total reflection. The further function is investigated with numerical calculation of a diffraction edge. In the experiment, Fresnel fringes generated by a rectangular aperture were measured by using a 300-μm platinum wire as the nanoslit. Its high potential use in imaging applications is discussed.",
keywords = "X-ray imaging, edge diffraction, metal wire",
author = "H. Takano and T. Hashimoto and T. Tsuji and T. Koyama and Y. Tsusaka and Y. Kagoshima",
year = "2010",
month = dec,
day = "1",
doi = "10.1063/1.3625363",
language = "English",
isbn = "9780735409255",
series = "AIP Conference Proceedings",
pages = "297--300",
booktitle = "10th International Conference on X-Ray Microscopy",
note = "10th International Conference on X-Ray Microscopy ; Conference date: 15-08-2010 Through 20-08-2010",
}