TY - JOUR
T1 - Note
T2 - Probing quadratic magneto-optical Kerr effects with a dual-beam system
AU - Trudel, Simon
AU - Wolf, Georg
AU - Schulthei, Helmut
AU - Hamrle, Jaroslav
AU - Hillebrands, Burkard
AU - Kubota, Takahide
AU - Ando, Yasuo
N1 - Funding Information:
Financial support from the DFG FG559, the JST strategic Japanese-German Cooperative Program on Nanoelectronics, and the Alexander von Humboldt Foundation (ST) is acknowledged. We thank G. Jakob (Mainz U., Germany) for providing the sample.
PY - 2010
Y1 - 2010
N2 - In this Note, we present a dual-beam magneto-optical Kerr effect (MOKE) magnetometer for the study of quadratic MOKE in magnetic thin films. The two beams simultaneously probe the sample, located in the middle of a quadrupole magnet, at two angles of incidence (0° and 45°). This combination of two systems allows one to automatically and routinely perform measurements that are sensitive to the combined longitudinal and quadratic MOKE signals (45°), or the quadratic effect alone (0°). Orientation-dependent and automated quantitative analyses of the quadratic effect's amplitude are also implemented. We present representative measurements on Heusler compound thin films to illustrate the newly combined capabilities of this instrument.
AB - In this Note, we present a dual-beam magneto-optical Kerr effect (MOKE) magnetometer for the study of quadratic MOKE in magnetic thin films. The two beams simultaneously probe the sample, located in the middle of a quadrupole magnet, at two angles of incidence (0° and 45°). This combination of two systems allows one to automatically and routinely perform measurements that are sensitive to the combined longitudinal and quadratic MOKE signals (45°), or the quadratic effect alone (0°). Orientation-dependent and automated quantitative analyses of the quadratic effect's amplitude are also implemented. We present representative measurements on Heusler compound thin films to illustrate the newly combined capabilities of this instrument.
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U2 - 10.1063/1.3276715
DO - 10.1063/1.3276715
M3 - Article
AN - SCOPUS:77949316516
SN - 0034-6748
VL - 81
JO - Review of Scientific Instruments
JF - Review of Scientific Instruments
IS - 2
M1 - 026105
ER -