TY - GEN
T1 - Numerical study of Cherenkov radiation from thin silica aerogel
AU - Hama, H.
AU - Nanbu, K.
AU - Saito, H.
AU - Saito, Y.
N1 - Funding Information:
* This work supported by JSPS KAKENHI: Grant numbers JP15K13394 and JP17H01070. † hama@lns.tohoku.ac.jp
Publisher Copyright:
© Proceedings of the 38th International Free-Electron Laser Conference, FEL 2017. All rights reserved.
PY - 2017
Y1 - 2017
N2 - Vavilov-Cherenkov radiation, usually just Cherenkov radiation (CR), is commonly used in high energy charged particle and cosmic rays detectors. We have studied CR emitted from very low refractive index material such as silica-aerogel and found it may be useful tool for electron beam diagnostics since the opening angle (Cherenkov angle) is small, then the CR can be transported onto a detector located far from the radiator. We have prepared a thin (1 mm thick) hydrophobic silica-aerogel having refractive index of 1.05 that has been developed at Chiba University. Since the intensity of CR is much stronger than that of optical transition radiation, the CR is a better light source for low intensity beam diagnostics. In order to apply the CR to measurement of bunch length of electron beams, we have investigated properties of CR by numerical simulation study based on the Liénard-Wiechert potentials. In addition, possibility of intense THz source is also discussed.
AB - Vavilov-Cherenkov radiation, usually just Cherenkov radiation (CR), is commonly used in high energy charged particle and cosmic rays detectors. We have studied CR emitted from very low refractive index material such as silica-aerogel and found it may be useful tool for electron beam diagnostics since the opening angle (Cherenkov angle) is small, then the CR can be transported onto a detector located far from the radiator. We have prepared a thin (1 mm thick) hydrophobic silica-aerogel having refractive index of 1.05 that has been developed at Chiba University. Since the intensity of CR is much stronger than that of optical transition radiation, the CR is a better light source for low intensity beam diagnostics. In order to apply the CR to measurement of bunch length of electron beams, we have investigated properties of CR by numerical simulation study based on the Liénard-Wiechert potentials. In addition, possibility of intense THz source is also discussed.
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U2 - 10.18429/JACoW-FEL2017-WEP027
DO - 10.18429/JACoW-FEL2017-WEP027
M3 - Conference contribution
AN - SCOPUS:85086372281
T3 - Proceedings of the 38th International Free-Electron Laser Conference, FEL 2017
SP - 479
EP - 481
BT - Proceedings of the 38th International Free-Electron Laser Conference, FEL 2017
A2 - Bishofberger, Kip
A2 - Bruce, Carlsten
A2 - Schaa, Volker RW
PB - JACoW Publishing
T2 - 38th International Free-Electron Laser Conference, FEL 2017
Y2 - 20 August 2017 through 25 August 2017
ER -