Observation of a local dipole moment of Si atoms on Si(100) surfaces using non-contact scanning nonlinear dielectric microscopy

Nobuhiro Kin, Yuhei Osa, Yasuo Cho

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

To confirm the performance of non-contact scanning nonlinear dielectric microscopy (NC-SNDM), we attempted to determine the local dipole moment of Si atoms on a Si(100) cleaned surface under UHV conditions. In conclusion, we succeeded in confirming the high resolution and reliability of NC-SNDM by observing the typical Si(100) surface structure with atomic resolution. In addition, we observed the local electric dipole moment distribution of Si atoms on a Si(100) 2 × 1 structure and studied the dc-bias voltage dependence of the local dipole moment induced on its surfaces.

Original languageEnglish
Title of host publicationTheory and Applications of Ferroelectric and Multiferroic Materials
PublisherMaterials Research Society
Pages108-113
Number of pages6
ISBN (Print)9781615677580
DOIs
Publication statusPublished - 2008
Event2008 MRS Fall Meeting - Boston, MA, United States
Duration: 2008 Dec 22008 Dec 4

Publication series

NameMaterials Research Society Symposium Proceedings
Volume1110
ISSN (Print)0272-9172

Conference

Conference2008 MRS Fall Meeting
Country/TerritoryUnited States
CityBoston, MA
Period08/12/208/12/4

Fingerprint

Dive into the research topics of 'Observation of a local dipole moment of Si atoms on Si(100) surfaces using non-contact scanning nonlinear dielectric microscopy'. Together they form a unique fingerprint.

Cite this