Abstract
We have developed scanning nonlinear dielectric microscopy (SNDM) that is the first successful purely electrical method for observing polarization distributions of ferroelectric materials. Now the resolution of SNDM has been improved to sub-nanometer. On the other hand, the piezoelectric response imaging (piezo-imaging) using scanning force microscopy (SFM) is well known as the method for observing the polarization distributions. In this study, we compare the resolution of SNDM with that of the piezo-imaging and confirm that the resolution of SNDM is much higher than that of piezo-imaging. Then, as the fundamental study to apply the SNDM system to a ferroelectric reading-recording system, we switched and observed the ferroelectric domains using the SNDM system.
| Original language | English |
|---|---|
| Pages (from-to) | 59-67 |
| Number of pages | 9 |
| Journal | Integrated Ferroelectrics |
| Volume | 38 |
| Issue number | 1-4 |
| DOIs | |
| Publication status | Published - 2001 |
| Event | 13th International Symposium on Integrated Ferroelectrics - Colorado Springs, CO, United States Duration: 2006 Mar 11 → 2006 Mar 14 |
Keywords
- Nano-domain forming
- Nonlinear dielectric imaging
- Piezoelectric response imaging
- Scanning nonlinear dielectric microscopy