Abstract
The surface dynamics of polyhedral oligomeric silsesquioxane (POSS)-functionalized polystyrene (PS-POSS) thin films above the glass transition temperature were studied by grazing-incidence X-ray photon correlation spectroscopy in order to elucidate the effects of POSS at the end of the polystyrene chains. Much slower fluctuations were observed in the surface of PS-POSS thin films than in the polystyrene thin films, despite the negligible difference in their bulk viscosity. Quantitative analysis based on fluctuation-dissipation theorem indicated that there is a high-viscosity layer at the surface of the PS-POSS films, and that the substrate interface originated from POSS segregation.
Original language | English |
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Pages (from-to) | 487-499 |
Number of pages | 13 |
Journal | Polymer |
Volume | 105 |
DOIs | |
Publication status | Published - 2016 Nov 22 |
Keywords
- Capillary wave
- Polymer thin film
- X-ray photon correlation spectroscopy
ASJC Scopus subject areas
- Organic Chemistry
- Polymers and Plastics
- Materials Chemistry