TY - JOUR
T1 - Observation of nanoscale ferroelectric domains using super-higher-order nonlinear dielectric microscopy
AU - Chinone, Norimichi
AU - Yamasue, Kohei
AU - Hiranaga, Yoshiomi
AU - Cho, Yasuo
PY - 2012/9
Y1 - 2012/9
N2 - Scanning nonlinear dielectric microscopy is a powerful technique for measuring the domain structure of ferroelectrics. We observed congruent LiTaO 3 and found the marked enhancement of nonlinear dielectric ''constants'' when the applied tip-sample voltage exceeded a particular threshold value. This is due to domain nucleation activated by a huge electric field under the tip. Moreover, low frequencies (less than a few hundred Hz) did not enhance the nonlinearity. An effectively lower electric field caused by ion conduction in the sample under the tip is a possible reason for the frequency-dependent characteristics of the enhanced nonlinearity for the applied voltage.
AB - Scanning nonlinear dielectric microscopy is a powerful technique for measuring the domain structure of ferroelectrics. We observed congruent LiTaO 3 and found the marked enhancement of nonlinear dielectric ''constants'' when the applied tip-sample voltage exceeded a particular threshold value. This is due to domain nucleation activated by a huge electric field under the tip. Moreover, low frequencies (less than a few hundred Hz) did not enhance the nonlinearity. An effectively lower electric field caused by ion conduction in the sample under the tip is a possible reason for the frequency-dependent characteristics of the enhanced nonlinearity for the applied voltage.
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U2 - 10.1143/JJAP.51.09LE07
DO - 10.1143/JJAP.51.09LE07
M3 - Article
AN - SCOPUS:84867767143
SN - 0021-4922
VL - 51
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
IS - 9 PART 2
M1 - 09LE07
ER -