On-chip and on-board RF noise coupling and impacts on LTE wireless communication performance (Invited)

Makoto Nagata; Noriyuki Miura; Sho Muroga; Satoshi Tanaka; Masahiro Yamaguchi

doi:10.1109/RFIT.2015.7377869

On-chip and on-board RF noise coupling and impacts on LTE wireless communication performance (Invited)

Makoto Nagata, Noriyuki Miura, Sho Muroga, Satoshi Tanaka, Masahiro Yamaguchi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

In-band interferers due to noise coupling from baseband digital circuits significantly impact on the wireless communication performance, in the case of single-chip system-level integration. The on-chip and off-chip (on-board) noise coupling are measured for visualizing the noise couplings. In addition, the hardware-in-the-loop simulation (HILS) estimates their impacts on the performance metrics like throughputs, under the interactions of interferers with the operation of LTE-compliant RF receiver circuits in a 65 nm CMOS technology.

Original language	English
Title of host publication	2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	7-9
Number of pages	3
ISBN (Electronic)	9781467377942
DOIs	https://doi.org/10.1109/RFIT.2015.7377869
Publication status	Published - 2016 Jan 8
Externally published	Yes
Event	IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Sendai, Japan Duration: 2015 Aug 26 → 2015 Aug 28

Publication series

Name	2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings

Other

Other	IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015
Country/Territory	Japan
City	Sendai
Period	15/8/26 → 15/8/28

Keywords

Chip-package-board interaction
Hardware-in-the-loop simulation
RF noise coupling

ASJC Scopus subject areas

Computer Networks and Communications
Electrical and Electronic Engineering

Access to Document

10.1109/RFIT.2015.7377869

Cite this

Nagata, M., Miura, N., Muroga, S., Tanaka, S., & Yamaguchi, M. (2016). On-chip and on-board RF noise coupling and impacts on LTE wireless communication performance (Invited). In 2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings (pp. 7-9). [7377869] (2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/RFIT.2015.7377869

On-chip and on-board RF noise coupling and impacts on LTE wireless communication performance (Invited). / Nagata, Makoto; Miura, Noriyuki; Muroga, Sho et al.
2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2016. p. 7-9 7377869 (2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Nagata, M, Miura, N, Muroga, S, Tanaka, S & Yamaguchi, M 2016, On-chip and on-board RF noise coupling and impacts on LTE wireless communication performance (Invited). in 2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings., 7377869, 2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings, Institute of Electrical and Electronics Engineers Inc., pp. 7-9, IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015, Sendai, Japan, 15/8/26. https://doi.org/10.1109/RFIT.2015.7377869

Nagata M, Miura N, Muroga S, Tanaka S, Yamaguchi M. On-chip and on-board RF noise coupling and impacts on LTE wireless communication performance (Invited). In 2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2016. p. 7-9. 7377869. (2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings). doi: 10.1109/RFIT.2015.7377869

Nagata, Makoto ; Miura, Noriyuki ; Muroga, Sho et al. / On-chip and on-board RF noise coupling and impacts on LTE wireless communication performance (Invited). 2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2016. pp. 7-9 (2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings).

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abstract = "In-band interferers due to noise coupling from baseband digital circuits significantly impact on the wireless communication performance, in the case of single-chip system-level integration. The on-chip and off-chip (on-board) noise coupling are measured for visualizing the noise couplings. In addition, the hardware-in-the-loop simulation (HILS) estimates their impacts on the performance metrics like throughputs, under the interactions of interferers with the operation of LTE-compliant RF receiver circuits in a 65 nm CMOS technology.",

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On-chip and on-board RF noise coupling and impacts on LTE wireless communication performance (Invited)

Abstract

Publication series

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Keywords

ASJC Scopus subject areas

Access to Document

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