Abstract
The resolution in conventional microscopy is limited by the wavelength of light. Near-field scanning optical microscopy (NSOM) is designed to avoid diffraction limits, providing resolution of nanometer-sized samples. Hitoshi Shiku and Robert C. Dunn of the University of Kansas describe the concepts behind NSOM and illustrate some of its applications.
| Original language | English |
|---|---|
| Pages (from-to) | 23A-29A |
| Journal | Analytical Chemistry |
| Volume | 71 |
| Issue number | 1 |
| Publication status | Published - 1999 Jan 1 |