On the cover. Near-field scanning optical microscopy

Hitoshi Shiku, Robert C. Dunn

Research output: Contribution to journalReview articlepeer-review

21 Citations (Scopus)


The resolution in conventional microscopy is limited by the wavelength of light. Near-field scanning optical microscopy (NSOM) is designed to avoid diffraction limits, providing resolution of nanometer-sized samples. Hitoshi Shiku and Robert C. Dunn of the University of Kansas describe the concepts behind NSOM and illustrate some of its applications.

Original languageEnglish
Pages (from-to)23A-29A
JournalAnalytical Chemistry
Issue number1
Publication statusPublished - 1999 Jan 1


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