TY - JOUR
T1 - Optical characterization of bulk GaN grown from a Na/Ga flux
AU - Palle, K.
AU - Chen, L.
AU - Liu, H. X.
AU - Skromme, B. J.
AU - Yamane, H.
AU - Aoki, M.
AU - Hoffman, C. B.
AU - DiSalvo, F. J.
PY - 2002
Y1 - 2002
N2 - Bulk GaN crystals up to several mm in size, grown by a Na/Ga flux method, have been characterized using room and low temperature photoluminescence (PL) and panchromatic cathodoluminescence (CL) imaging. Highly resolved excitonic PL spectra are obtained for material grown in a new, large-scale reactor. The crystal polarity affects the incorporation of residual Zn and Mg or Si acceptors and the deep level luminescence bands in c-oriented platelets. A Zn (A°,X) triplet structure with unusual thermalization properties and a highly resolved structural defect related PL peak are observed. Striations are found in some of the smaller platelets by CL imaging, but are absent in the prismatic crystals.
AB - Bulk GaN crystals up to several mm in size, grown by a Na/Ga flux method, have been characterized using room and low temperature photoluminescence (PL) and panchromatic cathodoluminescence (CL) imaging. Highly resolved excitonic PL spectra are obtained for material grown in a new, large-scale reactor. The crystal polarity affects the incorporation of residual Zn and Mg or Si acceptors and the deep level luminescence bands in c-oriented platelets. A Zn (A°,X) triplet structure with unusual thermalization properties and a highly resolved structural defect related PL peak are observed. Striations are found in some of the smaller platelets by CL imaging, but are absent in the prismatic crystals.
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U2 - 10.1557/proc-743-l3.36
DO - 10.1557/proc-743-l3.36
M3 - Conference article
AN - SCOPUS:0038710549
SN - 0272-9172
VL - 743
SP - 201
EP - 206
JO - Materials Research Society Symposium - Proceedings
JF - Materials Research Society Symposium - Proceedings
T2 - Gan and Related Alloys - 2002
Y2 - 2 December 2002 through 6 December 2002
ER -