TY - GEN
T1 - Optical surface profile measurement of operating electric contact
AU - Sugimoto, Hitoshi
AU - Sone, Hideaki
AU - Takagi, Tasuku
N1 - Publisher Copyright:
© 1994 IEEE.
PY - 1994
Y1 - 1994
N2 - A measuring system for three dimensional (3D) surface profile of an operating electric contact (switch) was applied to experiments on relationship between contact performance and its phenomena. The system developed by the authors measures a 1mm diameter surface of an electric contact electrode with 10um resolution within 4 seconds. The configuration of the system and results of the experiment are described.
AB - A measuring system for three dimensional (3D) surface profile of an operating electric contact (switch) was applied to experiments on relationship between contact performance and its phenomena. The system developed by the authors measures a 1mm diameter surface of an electric contact electrode with 10um resolution within 4 seconds. The configuration of the system and results of the experiment are described.
UR - http://www.scopus.com/inward/record.url?scp=85064633714&partnerID=8YFLogxK
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U2 - 10.1109/IMTC.1994.351807
DO - 10.1109/IMTC.1994.351807
M3 - Conference contribution
AN - SCOPUS:85064633714
T3 - Conference Proceedings - 10th Anniv., IMTC 1994: Advanced Technologies in I and M. 1994 IEEE Instrumentation and Measurement Technology Conference
SP - 1341
EP - 1344
BT - Conference Proceedings - 10th Anniv., IMTC 1994
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 1994 IEEE Instrumentation and Measurement Technology Conference, IMTC 1994
Y2 - 10 May 1994 through 12 May 1994
ER -