TY - JOUR
T1 - Optical transient spectrum analyzer (OTSA) with high time‐resolution
AU - Sato, Kiminori
AU - Nagasawa, Yoji
AU - Sone, Hideaki
AU - Takagi, Tasuku
N1 - Copyright:
Copyright 2016 Elsevier B.V., All rights reserved.
PY - 1990
Y1 - 1990
N2 - To analyze optical sources with time‐varying spectra, an optical transient spectrum analyzer (OTSA) with high time resolution is developed. In the spectrum analyzer, the dispersive light is focused on the CCD by a lens and each pixel of the CCD is made to correspond to one spectrum line. It is possible to realize wavelength resolutions between 0.2 and 0.63 nm by changing the optical elements. Variations of extraction pixels of CCD allow time resolutions between 23 μs and 1 ms. Therefore, various applications (such as optical source analyzing systems) are expected. The data from CCD are A‐D transformed and stored in a floppy disk. Therefore, it becomes possible to discuss the characteristics of the optical sources quantitatively. Finally, as an example, the transient mode‐hopping phenomenon of a semiconductor laser is time resolved with high speed and its three‐dimensional (3‐D) observation is presented.
AB - To analyze optical sources with time‐varying spectra, an optical transient spectrum analyzer (OTSA) with high time resolution is developed. In the spectrum analyzer, the dispersive light is focused on the CCD by a lens and each pixel of the CCD is made to correspond to one spectrum line. It is possible to realize wavelength resolutions between 0.2 and 0.63 nm by changing the optical elements. Variations of extraction pixels of CCD allow time resolutions between 23 μs and 1 ms. Therefore, various applications (such as optical source analyzing systems) are expected. The data from CCD are A‐D transformed and stored in a floppy disk. Therefore, it becomes possible to discuss the characteristics of the optical sources quantitatively. Finally, as an example, the transient mode‐hopping phenomenon of a semiconductor laser is time resolved with high speed and its three‐dimensional (3‐D) observation is presented.
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U2 - 10.1002/ecjb.4420731005
DO - 10.1002/ecjb.4420731005
M3 - Article
AN - SCOPUS:0025505245
SN - 8756-663X
VL - 73
SP - 42
EP - 50
JO - Electronics and Communications in Japan, Part II: Electronics (English translation of Denshi Tsushin Gakkai Ronbunshi)
JF - Electronics and Communications in Japan, Part II: Electronics (English translation of Denshi Tsushin Gakkai Ronbunshi)
IS - 10
ER -