Abstract
Magnetoresistance (MR) in ambipolar field-effect transistors (FETs) consisting of bilayers of pentacene (C22H14, PEN) and perfluoropentacene (C22F14, PFP) was studied. The ambipolar FET exhibits positive MR of approximately 1 at 100 mT and room temperature. This effect is considered to originate from the accumulated carriers at the interface between PEN and PFP. The gate voltage dependence showed that MR was enhanced with increasing number of electrons and holes accumulated at the PFP-PEN interface. The observed results support the proposed double-carrier models as the mechanism of organic magnetoresistance.
Original language | English |
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Article number | 143301 |
Journal | Applied Physics Letters |
Volume | 103 |
Issue number | 14 |
DOIs | |
Publication status | Published - 2013 Sept 30 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)