Origin of second-order nonlinear optical response of polarity-controlled ZnO films

J. S. Park, Y. Yamazaki, Y. Takahashi, S. K. Hong, J. H. Chang, T. Fujiwara, T. Yao

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)

Abstract

Polarity-controlled ZnO thin films grown on different buffer layers were investigated as nonlinear optical materials for second harmonic generation. The effective nonlinear optical coefficient (deff) of ZnO grown on Cr-compound buffer layers showed a higher value than that of ZnO grown on MgO buffer layers. The correlations among the grain size and surface roughness with the values of deff were found to be strong. The deff of the ZnO film increased with decrease in the grain size and surface roughness. This relationship could be explained by the increase in reaction interface and the decrease in scattering probability at the surface as decrease in grain size and surface roughness, respectively.

Original languageEnglish
Article number231118
JournalApplied Physics Letters
Volume94
Issue number23
DOIs
Publication statusPublished - 2009

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