TY - GEN
T1 - Palmtop EPMA by electric battery
AU - Imashuku, Susumu
AU - Imanishi, Akira
AU - Kawai, Jun
PY - 2012
Y1 - 2012
N2 - The measurement pressure of a palmtop electron probe X-ray microanalyzer (EPMA) we previously reported was reduced using stainless steel vacuum flanges for the chamber instead of a borosilicate glass tube. The improved palmtop EPMA could reach the measurement pressure of 1 Pa in 5 minutes. The time was more than twice shorter than that to reach the measurement pressure of 5 Pa with the palmtop EPMA we previously reported. Titanium, copper K lines and silver Lα line were observed during 90 seconds measurement in addition to chromium, iron, and nickel K lines when titanium, copper, and silver plates were placed on the carbon sample stage. Chromium, iron, and nickel K lines came from stainless steel, and copper K lines came from copper rod and copper plate placed on the sample stage. The improved palmtop EPMA can analyze metals except for chromium, iron, nickel, and small amount of copper in 90 seconds.
AB - The measurement pressure of a palmtop electron probe X-ray microanalyzer (EPMA) we previously reported was reduced using stainless steel vacuum flanges for the chamber instead of a borosilicate glass tube. The improved palmtop EPMA could reach the measurement pressure of 1 Pa in 5 minutes. The time was more than twice shorter than that to reach the measurement pressure of 5 Pa with the palmtop EPMA we previously reported. Titanium, copper K lines and silver Lα line were observed during 90 seconds measurement in addition to chromium, iron, and nickel K lines when titanium, copper, and silver plates were placed on the carbon sample stage. Chromium, iron, and nickel K lines came from stainless steel, and copper K lines came from copper rod and copper plate placed on the sample stage. The improved palmtop EPMA can analyze metals except for chromium, iron, nickel, and small amount of copper in 90 seconds.
KW - Palmtop EPMA
KW - Pyroelectric crystal
UR - http://www.scopus.com/inward/record.url?scp=84863614063&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84863614063&partnerID=8YFLogxK
U2 - 10.1063/1.3703338
DO - 10.1063/1.3703338
M3 - Conference contribution
AN - SCOPUS:84863614063
SN - 9780735410275
T3 - AIP Conference Proceedings
SP - 29
EP - 31
BT - X-Ray Optics and Microanalysis - Proceedings of the 21st International Congress, ICXOM21
T2 - 21st International Congress on X-Ray Optics and Microanalysis, ICXOM21
Y2 - 5 September 2011 through 9 September 2011
ER -