Palmtop EPMA by electric battery

Susumu Imashuku, Akira Imanishi, Jun Kawai

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)


The measurement pressure of a palmtop electron probe X-ray microanalyzer (EPMA) we previously reported was reduced using stainless steel vacuum flanges for the chamber instead of a borosilicate glass tube. The improved palmtop EPMA could reach the measurement pressure of 1 Pa in 5 minutes. The time was more than twice shorter than that to reach the measurement pressure of 5 Pa with the palmtop EPMA we previously reported. Titanium, copper K lines and silver Lα line were observed during 90 seconds measurement in addition to chromium, iron, and nickel K lines when titanium, copper, and silver plates were placed on the carbon sample stage. Chromium, iron, and nickel K lines came from stainless steel, and copper K lines came from copper rod and copper plate placed on the sample stage. The improved palmtop EPMA can analyze metals except for chromium, iron, nickel, and small amount of copper in 90 seconds.

Original languageEnglish
Title of host publicationX-Ray Optics and Microanalysis - Proceedings of the 21st International Congress, ICXOM21
Number of pages3
Publication statusPublished - 2012
Event21st International Congress on X-Ray Optics and Microanalysis, ICXOM21 - Campinas, Brazil
Duration: 2011 Sept 52011 Sept 9

Publication series

NameAIP Conference Proceedings
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616


Conference21st International Congress on X-Ray Optics and Microanalysis, ICXOM21


  • Palmtop EPMA
  • Pyroelectric crystal


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