The measurement pressure of a palmtop electron probe X-ray microanalyzer (EPMA) we previously reported was reduced using stainless steel vacuum flanges for the chamber instead of a borosilicate glass tube. The improved palmtop EPMA could reach the measurement pressure of 1 Pa in 5 minutes. The time was more than twice shorter than that to reach the measurement pressure of 5 Pa with the palmtop EPMA we previously reported. Titanium, copper K lines and silver Lα line were observed during 90 seconds measurement in addition to chromium, iron, and nickel K lines when titanium, copper, and silver plates were placed on the carbon sample stage. Chromium, iron, and nickel K lines came from stainless steel, and copper K lines came from copper rod and copper plate placed on the sample stage. The improved palmtop EPMA can analyze metals except for chromium, iron, nickel, and small amount of copper in 90 seconds.