Penetration depth of transverse spin current in (001)-oriented epitaxial ferromagnetic films

Augustin L. Kwilu; Hiroshi Naganuma; Mikihiko Oogane; Yasuo Ando

doi:10.1016/j.jmmm.2014.05.043

Penetration depth of transverse spin current in (001)-oriented epitaxial ferromagnetic films

Augustin L. Kwilu, Hiroshi Naganuma, Mikihiko Oogane, Yasuo Ando

Tohoku University

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

We fabricated (001)-oriented epitaxial four-layered thin films of Cr/Co₂MnSi/Cu/Co₅₀Fe₅₀ by dc magnetron sputtering in order to investigate the physical characteristics of the transverse spin current. The penetration depth ^λT characterizes the transverse spin current generated by the spin pumping effect that takes place in a film subjected to an external magnetic field. By analyzing the dependence on the Co₅₀Fe₅₀ thickness of the peak-to-peak line widths of ferromagnetic resonance, we determined ^λT within the Co₅₀Fe₅₀ layer and found it to be ^λT=0.9nm.

Original language	English
Pages (from-to)	333-337
Number of pages	5
Journal	Journal of Magnetism and Magnetic Materials
Volume	368
DOIs	https://doi.org/10.1016/j.jmmm.2014.05.043
Publication status	Published - 2014 Nov

Keywords

Mixing conductance
Spin penetration depth
Spin pumping

Access to Document

10.1016/j.jmmm.2014.05.043

Cite this

@article{69208a7555e544f4aa158f9caf5210fd,

title = "Penetration depth of transverse spin current in (001)-oriented epitaxial ferromagnetic films",

abstract = "We fabricated (001)-oriented epitaxial four-layered thin films of Cr/Co2MnSi/Cu/Co50Fe50 by dc magnetron sputtering in order to investigate the physical characteristics of the transverse spin current. The penetration depth λT characterizes the transverse spin current generated by the spin pumping effect that takes place in a film subjected to an external magnetic field. By analyzing the dependence on the Co50Fe50 thickness of the peak-to-peak line widths of ferromagnetic resonance, we determined λT within the Co50Fe50 layer and found it to be λT=0.9nm.",

keywords = "Mixing conductance, Spin penetration depth, Spin pumping",

author = "Kwilu, {Augustin L.} and Hiroshi Naganuma and Mikihiko Oogane and Yasuo Ando",

note = "Funding Information: This work was partly supported by the Strategic Japanese–German Cooperative program (ASPIMATT) of the Japan Science Technology Agency (JSPS KAKENHI 24226001) . My sincerest gratitude is extended to the Japanese Government for funding my research through the Ministry of Education (Monbukagakusho) (MEXT) . I would also like to thank Professor G. E. W. Bauer, Professor Masafumi Shirai, Professor A. Fert and Dr. Taniguchi for the fruitful discussions I had with them. ",

year = "2014",

month = nov,

doi = "10.1016/j.jmmm.2014.05.043",

language = "English",

volume = "368",

pages = "333--337",

journal = "Journal of Magnetism and Magnetic Materials",

issn = "0304-8853",

publisher = "Elsevier",

}

TY - JOUR

T1 - Penetration depth of transverse spin current in (001)-oriented epitaxial ferromagnetic films

AU - Kwilu, Augustin L.

AU - Naganuma, Hiroshi

AU - Oogane, Mikihiko

AU - Ando, Yasuo

N1 - Funding Information: This work was partly supported by the Strategic Japanese–German Cooperative program (ASPIMATT) of the Japan Science Technology Agency (JSPS KAKENHI 24226001) . My sincerest gratitude is extended to the Japanese Government for funding my research through the Ministry of Education (Monbukagakusho) (MEXT) . I would also like to thank Professor G. E. W. Bauer, Professor Masafumi Shirai, Professor A. Fert and Dr. Taniguchi for the fruitful discussions I had with them.

PY - 2014/11

Y1 - 2014/11

N2 - We fabricated (001)-oriented epitaxial four-layered thin films of Cr/Co2MnSi/Cu/Co50Fe50 by dc magnetron sputtering in order to investigate the physical characteristics of the transverse spin current. The penetration depth λT characterizes the transverse spin current generated by the spin pumping effect that takes place in a film subjected to an external magnetic field. By analyzing the dependence on the Co50Fe50 thickness of the peak-to-peak line widths of ferromagnetic resonance, we determined λT within the Co50Fe50 layer and found it to be λT=0.9nm.

AB - We fabricated (001)-oriented epitaxial four-layered thin films of Cr/Co2MnSi/Cu/Co50Fe50 by dc magnetron sputtering in order to investigate the physical characteristics of the transverse spin current. The penetration depth λT characterizes the transverse spin current generated by the spin pumping effect that takes place in a film subjected to an external magnetic field. By analyzing the dependence on the Co50Fe50 thickness of the peak-to-peak line widths of ferromagnetic resonance, we determined λT within the Co50Fe50 layer and found it to be λT=0.9nm.

KW - Mixing conductance

KW - Spin penetration depth

KW - Spin pumping

UR - http://www.scopus.com/inward/record.url?scp=84903185731&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84903185731&partnerID=8YFLogxK

U2 - 10.1016/j.jmmm.2014.05.043

DO - 10.1016/j.jmmm.2014.05.043

M3 - Article

AN - SCOPUS:84903185731

SN - 0304-8853

VL - 368

SP - 333

EP - 337

JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

ER -

Penetration depth of transverse spin current in (001)-oriented epitaxial ferromagnetic films

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this