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Performance limit of parallel electric field tunnel FET and improvement by modified gate and channel configurations
Y. Morita, T. Mori, S. Migita, W. Mizubayashi, A. Tanabe, K. Fukuda, T. Matsukawa, Kazuhiko Endo, S. O'uchi, Y. X. Liu, M. Masahara, H. Ota
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
5
Citations
(Scopus)