Perpendicular exchange bias independent of NiO layer thickness in NiO/CoPt structures with orthogonal spin configuration

Ying Gao, Hiroto Sakimura, Hangxian Gao, Tenghua Gao, Jian Wang, Kazuya Ando, Takashi Harumoto, Yoshio Nakamura, Ji Shi

    Research output: Contribution to journalArticlepeer-review

    3 Citations (Scopus)


    We report on an investigation of the orthogonal coupling system of a NiO/CoPt bilayer on a Pt(111)/glass substrate, with CoPt showing strong perpendicular magnetic anisotropy. This system displays a favorable perpendicular exchange bias with an exchange bias field as high as-900 Oe, exceeding most of the results reported so far from various NiO/FM exchange coupling systems. In contrast to the general bottom-pinned stacking sequence, in this research we placed an antiferromagnetic layer on top of a ferromagnetic layer; an interesting new phenomenon was observed-the loop shift amplitude does not change with the thickness of the antiferromagnet, which is explained in detail by modeling and computing. We demonstrate a modified random field model by applying Malozemoff's assumption to a 'spin flop' coupling system, in which interface roughness plays a crucial role. A simulation on the basis of the random field model agrees well with the experimental observations.

    Original languageEnglish
    Article number225002
    JournalJournal of Physics D: Applied Physics
    Issue number22
    Publication statusPublished - 2020 May 27


    • AFM thickness
    • exchange bias
    • interface roughness
    • random field model
    • spin flop

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Acoustics and Ultrasonics
    • Surfaces, Coatings and Films


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