Perpendicular magnetic anisotropy of Mn4N films on MgO(001) and SrTiO3(001) substrates

Yoko Yasutomi; Keita Ito; Tatsunori Sanai; Kaoru Toko; Takashi Suemasu

doi:10.1063/1.4867955

Perpendicular magnetic anisotropy of Mn₄N films on MgO(001) and SrTiO₃(001) substrates

Yoko Yasutomi, Keita Ito, Tatsunori Sanai, Kaoru Toko, Takashi Suemasu

Research output: Contribution to journal › Article › peer-review

69 Citations (Scopus)

Abstract

We grew Mn₄N epitaxial thin films capped with Au layers on MgO(001) and SrTiO₃(001) substrates by molecular beam epitaxy. Perpendicular magnetic anisotropy (PMA) was confirmed in all the samples at room temperature from the magnetization versus magnetic field curves using superconducting quantum interference device magnetometer. From the ω-2θ x-ray diffraction (XRD) and ?-2θ_χ XRD patterns, the ratios of perpendicular lattice constant c to in-plane lattice constant a, c/a, were found to be about 0.99 for all the samples. These results imply that PMA is attributed to the in-plane tensile strain in the Mn ₄N films.

Original language	English
Article number	17A935
Journal	Journal of Applied Physics
Volume	115
Issue number	17
DOIs	https://doi.org/10.1063/1.4867955
Publication status	Published - 2014 May 7
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy(all)

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abstract = "We grew Mn4N epitaxial thin films capped with Au layers on MgO(001) and SrTiO3(001) substrates by molecular beam epitaxy. Perpendicular magnetic anisotropy (PMA) was confirmed in all the samples at room temperature from the magnetization versus magnetic field curves using superconducting quantum interference device magnetometer. From the ω-2θ x-ray diffraction (XRD) and ?-2θχ XRD patterns, the ratios of perpendicular lattice constant c to in-plane lattice constant a, c/a, were found to be about 0.99 for all the samples. These results imply that PMA is attributed to the in-plane tensile strain in the Mn 4N films.",

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T1 - Perpendicular magnetic anisotropy of Mn4N films on MgO(001) and SrTiO3(001) substrates

AU - Yasutomi, Yoko

AU - Ito, Keita

AU - Sanai, Tatsunori

AU - Toko, Kaoru

AU - Suemasu, Takashi

PY - 2014/5/7

Y1 - 2014/5/7

N2 - We grew Mn4N epitaxial thin films capped with Au layers on MgO(001) and SrTiO3(001) substrates by molecular beam epitaxy. Perpendicular magnetic anisotropy (PMA) was confirmed in all the samples at room temperature from the magnetization versus magnetic field curves using superconducting quantum interference device magnetometer. From the ω-2θ x-ray diffraction (XRD) and ?-2θχ XRD patterns, the ratios of perpendicular lattice constant c to in-plane lattice constant a, c/a, were found to be about 0.99 for all the samples. These results imply that PMA is attributed to the in-plane tensile strain in the Mn 4N films.

AB - We grew Mn4N epitaxial thin films capped with Au layers on MgO(001) and SrTiO3(001) substrates by molecular beam epitaxy. Perpendicular magnetic anisotropy (PMA) was confirmed in all the samples at room temperature from the magnetization versus magnetic field curves using superconducting quantum interference device magnetometer. From the ω-2θ x-ray diffraction (XRD) and ?-2θχ XRD patterns, the ratios of perpendicular lattice constant c to in-plane lattice constant a, c/a, were found to be about 0.99 for all the samples. These results imply that PMA is attributed to the in-plane tensile strain in the Mn 4N films.

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Perpendicular magnetic anisotropy of Mn₄N films on MgO(001) and SrTiO₃(001) substrates

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