Phase Detection of High-Frequency Carrier-Type Thin-Film Sensor

S. Yabukami, H. Mawatari, O. Shimoe, K. I. Arai

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)


We propose, herein, a method by which to measure the phase of the carrier in a high-frequency carrier-type sensor (giant magneto impedance sensor). The proposed method is based on a carrier suppression technique. The phase of the carrier signal changed dramatically by approximately 180° around the carrier suppression when a small dc field was applied. The phase sensitivity for a small dc field reached 3600°/Oe. In addition, in the present study, we investigate the relationship between phase sensitivity and suppressed carrier level in the suppression circuit, the measured data nearly corresponded to theoretical data.

Original languageEnglish
Pages (from-to)3196-3198
Number of pages3
JournalIEEE Transactions on Magnetics
Issue number5 II
Publication statusPublished - 2003 Sept


  • Carrier suppression technique
  • Giant magneto impedance (GMI)
  • High-frequency carrier-type sensor
  • Phase detection
  • Thin film


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