Photoelectron Yield Spectroscopy available in both vacuum and atmospheric conditions: Measurements of ionization potentials and interfacial elecetronic structures of organic semiconductors

Hisao Ishii; Tamotsu Suenaga; Nobuyuki Sato; Daisuke Tsunami; Yasuo Kimura; Michio Niwano

Photoelectron Yield Spectroscopy available in both vacuum and atmospheric conditions: Measurements of ionization potentials and interfacial elecetronic structures of organic semiconductors

Hisao Ishii, Tamotsu Suenaga, Nobuyuki Sato, Daisuke Tsunami, Yasuo Kimura, Michio Niwano

Information Devices Division

Research output: Contribution to conference › Paper › peer-review

Abstract

We have developed a photoelectron yield Spectroscopy (PYS) apparatus which enables us to measure work functions of metal electrodes and ionization potentials (IPs) of organic electronic materials in both vacuum and atmospheric conditions. By using UV spectral light source purged by nitrogen gas and sub-pico ammeter for detecting photoelectrons, our apparatus can measure a wide range of IPs of organic materials including not only hole transporting materials but also electron transporting materials. We will report on the details of the apparatus as well as some examples of the measurements. In addition, the application of this technique to characterize the electronic structure of organic / metal interfaces will be also reported.

Original language	English
Pages	4468-4469
Number of pages	2
Publication status	Published - 2005 Dec 1
Event	54th SPSJ Symposium on Macromolecules - Yamagata, Japan Duration: 2005 Sept 20 → 2005 Sept 22

Other

Other	54th SPSJ Symposium on Macromolecules
Country/Territory	Japan
City	Yamagata
Period	05/9/20 → 05/9/22

Keywords

Interface
Ionization Potential
Organic Electronic Materials
Photoelectron Yield Spectroscopy
Work Function

ASJC Scopus subject areas

Engineering(all)

Cite this

Photoelectron Yield Spectroscopy available in both vacuum and atmospheric conditions: Measurements of ionization potentials and interfacial elecetronic structures of organic semiconductors. / Ishii, Hisao; Suenaga, Tamotsu; Sato, Nobuyuki et al.
2005. 4468-4469 Paper presented at 54th SPSJ Symposium on Macromolecules, Yamagata, Japan.

Research output: Contribution to conference › Paper › peer-review

Ishii, H, Suenaga, T, Sato, N, Tsunami, D, Kimura, Y & Niwano, M 2005, 'Photoelectron Yield Spectroscopy available in both vacuum and atmospheric conditions: Measurements of ionization potentials and interfacial elecetronic structures of organic semiconductors', Paper presented at 54th SPSJ Symposium on Macromolecules, Yamagata, Japan, 05/9/20 - 05/9/22 pp. 4468-4469.

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abstract = "We have developed a photoelectron yield Spectroscopy (PYS) apparatus which enables us to measure work functions of metal electrodes and ionization potentials (IPs) of organic electronic materials in both vacuum and atmospheric conditions. By using UV spectral light source purged by nitrogen gas and sub-pico ammeter for detecting photoelectrons, our apparatus can measure a wide range of IPs of organic materials including not only hole transporting materials but also electron transporting materials. We will report on the details of the apparatus as well as some examples of the measurements. In addition, the application of this technique to characterize the electronic structure of organic / metal interfaces will be also reported.",

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T1 - Photoelectron Yield Spectroscopy available in both vacuum and atmospheric conditions

T2 - 54th SPSJ Symposium on Macromolecules

AU - Ishii, Hisao

AU - Suenaga, Tamotsu

AU - Sato, Nobuyuki

AU - Tsunami, Daisuke

AU - Kimura, Yasuo

AU - Niwano, Michio

PY - 2005/12/1

Y1 - 2005/12/1

N2 - We have developed a photoelectron yield Spectroscopy (PYS) apparatus which enables us to measure work functions of metal electrodes and ionization potentials (IPs) of organic electronic materials in both vacuum and atmospheric conditions. By using UV spectral light source purged by nitrogen gas and sub-pico ammeter for detecting photoelectrons, our apparatus can measure a wide range of IPs of organic materials including not only hole transporting materials but also electron transporting materials. We will report on the details of the apparatus as well as some examples of the measurements. In addition, the application of this technique to characterize the electronic structure of organic / metal interfaces will be also reported.

AB - We have developed a photoelectron yield Spectroscopy (PYS) apparatus which enables us to measure work functions of metal electrodes and ionization potentials (IPs) of organic electronic materials in both vacuum and atmospheric conditions. By using UV spectral light source purged by nitrogen gas and sub-pico ammeter for detecting photoelectrons, our apparatus can measure a wide range of IPs of organic materials including not only hole transporting materials but also electron transporting materials. We will report on the details of the apparatus as well as some examples of the measurements. In addition, the application of this technique to characterize the electronic structure of organic / metal interfaces will be also reported.

KW - Interface

KW - Ionization Potential

KW - Organic Electronic Materials

KW - Photoelectron Yield Spectroscopy

KW - Work Function

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Y2 - 20 September 2005 through 22 September 2005

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Photoelectron Yield Spectroscopy available in both vacuum and atmospheric conditions: Measurements of ionization potentials and interfacial elecetronic structures of organic semiconductors

Abstract

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Keywords

ASJC Scopus subject areas

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