Photoemission study of local structure of amorphous GeSe

T. Takahashi, T. Sagawa

Research output: Contribution to journalLetterpeer-review

7 Citations (Scopus)

Abstract

Photoemission (XPS and UPS) spectra have been measured for an amorphous GeSe film deposited onto a cooled substrate before and after thermal annealing of the film. The photoemission spectra show a remarkable change in the 4p and the Ge 4s region. A comparison of the experimental results with the recently presented electronic structure calculations reveals that an amorphous GeSe film deposited onto a cooled substrate has a 3-3 coordination character and relaxes into a chemically ordered 4-2 coordinated structure upon thermal annealing.

Original languageEnglish
Pages (from-to)195-199
Number of pages5
JournalJournal of Non-Crystalline Solids
Volume53
Issue number1-2
DOIs
Publication statusPublished - 1982 Dec 2

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