Photoemission (UPS and XPS) study of crystallization of amorphous GeTe film

T. Takahashi, H. Sakurai, T. Sagawa

Research output: Contribution to journalArticlepeer-review

13 Citations (Scopus)


In situ photoemission (UPS and XPS) measurements have been performed for amorphous GeTe films. The photoemission spectra exhibit a drastic change upon thermal annealing and/or the crystallization of the film. It has been found that an amorphous GeTe film deposited onto a room temperature substrate has a 4-2 coordinated local structure, while a highly disordered amorphous GeTe film evaporated onto a cooled (77 K) substrate is largely 3-3 coordinated, and relaxes into the 4-2 coordinated structure upon thermal annealing within amorphous phase.

Original languageEnglish
Pages (from-to)723-726
Number of pages4
JournalSolid State Communications
Issue number5
Publication statusPublished - 1982 Nov


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