TY - JOUR
T1 - Polarization dependence of resonant inelastic X-ray scattering spectroscopy in correlated electron systems
AU - Ishihara, Sumio
AU - Ihara, Satoshi
N1 - Funding Information:
This work was supported by JSPS KAKENHI (16104005), and TOKUTEI (18044001, 19014003) from MEXT, NAREGI and CREST. The authors thank K. Ishii, Y. Murakami and J. Mizuki for their valuable discussion, and K. Tsutsui and H. Matsueda for the valuable information regarding the numerical technique.
PY - 2008/12
Y1 - 2008/12
N2 - Resonant inelastic X-ray scattering (RIXS) at the transition-metal K-edge is studied as a tool to detect the electronic structure in correlated electron systems. We, in particular, focus on the polarization dependence of RIXS intensity and symmetry of the electronic excitations. It is shown that by analyzing the polarization of the initial and scattered X-rays, the symmetry of the 4 p orbitals are selected. Combined effects of the polarization of X-rays and the momentum transfer in the scattering are also studied.
AB - Resonant inelastic X-ray scattering (RIXS) at the transition-metal K-edge is studied as a tool to detect the electronic structure in correlated electron systems. We, in particular, focus on the polarization dependence of RIXS intensity and symmetry of the electronic excitations. It is shown that by analyzing the polarization of the initial and scattered X-rays, the symmetry of the 4 p orbitals are selected. Combined effects of the polarization of X-rays and the momentum transfer in the scattering are also studied.
KW - A. Oxides
KW - C. X-ray diffraction
KW - D. Electronic structure
KW - D. Magnetic properties
KW - D. Superconductivity
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U2 - 10.1016/j.jpcs.2008.06.051
DO - 10.1016/j.jpcs.2008.06.051
M3 - Article
AN - SCOPUS:57049139553
SN - 0022-3697
VL - 69
SP - 3184
EP - 3186
JO - Journal of Physics and Chemistry of Solids
JF - Journal of Physics and Chemistry of Solids
IS - 12
ER -