Abstract
We have measured the polarization degree of the B ls exciton emission from h-BN under resonance excitation using a multilayer rotating analyzer. We used a Mo/C 101 layers in total as a soft-x-ray polarizer. The emission would include the luminescence component due to the direct recombination of the core exciton and the elastic (Rayleigh) scattering of the incident light. We have found a definite contribution of the recombination luminescence to the exciton emission peak.
| Original language | English |
|---|---|
| Pages (from-to) | 96-99 |
| Number of pages | 4 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 2873 |
| DOIs | |
| Publication status | Published - 1996 Aug 16 |
| Event | International Symposium on Polarization Analysis and Applications to Device Technology 1996 - Yokohama, Japan Duration: 1996 Jun 12 → 1996 Jun 14 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering