TY - JOUR
T1 - Portable total reflection x-ray fluorescence analysis in the identification of unknown laboratory hazards
AU - Liu, Ying
AU - Imashuku, Susumu
AU - Sasaki, Nobuharu
AU - Ze, Long
AU - Kawai, Jun
AU - Takano, Shotaro
AU - Sohrin, Yoshiki
AU - Seki, Hiroko
AU - Miyauchi, Hiroya
PY - 2014/5/1
Y1 - 2014/5/1
N2 - In this study, a portable total reflection x-ray fluorescence (TXRF) spectrometer was used to analyze unknown laboratory hazards that precipitated on exterior surfaces of cooling pipes and fume hood pipes in chemical laboratories. With the aim to examine the accuracy of TXRF analysis for the determination of elemental composition, analytical results were compared with those of wavelength-dispersive x-ray fluorescence spectrometry, scanning electron microscope and energy-dispersive x-ray spectrometry, energy-dispersive x-ray fluorescence spectrometry, inductively coupled plasma atomic emission spectrometry, x-ray diffraction spectrometry (XRD), and x-ray photoelectron spectroscopy (XPS). Detailed comparison of data confirmed that the TXRF method itself was not sufficient to determine all the elements (Z > 11) contained in the samples. In addition, results suggest that XRD should be combined with XPS in order to accurately determine compound composition. This study demonstrates that at least two analytical methods should be used in order to analyze the composition of unknown real samples.
AB - In this study, a portable total reflection x-ray fluorescence (TXRF) spectrometer was used to analyze unknown laboratory hazards that precipitated on exterior surfaces of cooling pipes and fume hood pipes in chemical laboratories. With the aim to examine the accuracy of TXRF analysis for the determination of elemental composition, analytical results were compared with those of wavelength-dispersive x-ray fluorescence spectrometry, scanning electron microscope and energy-dispersive x-ray spectrometry, energy-dispersive x-ray fluorescence spectrometry, inductively coupled plasma atomic emission spectrometry, x-ray diffraction spectrometry (XRD), and x-ray photoelectron spectroscopy (XPS). Detailed comparison of data confirmed that the TXRF method itself was not sufficient to determine all the elements (Z > 11) contained in the samples. In addition, results suggest that XRD should be combined with XPS in order to accurately determine compound composition. This study demonstrates that at least two analytical methods should be used in order to analyze the composition of unknown real samples.
UR - http://www.scopus.com/inward/record.url?scp=84896266595&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84896266595&partnerID=8YFLogxK
U2 - 10.1116/1.4867462
DO - 10.1116/1.4867462
M3 - Article
AN - SCOPUS:84896266595
SN - 0734-2101
VL - 32
JO - Journal of Vacuum Science and Technology A
JF - Journal of Vacuum Science and Technology A
IS - 3
M1 - 031401
ER -