Vanadium samples with controlled oxygen impurity content (6-2460 at.ppm) were irradiated with fast neutrons to a fluence of 8.3×1018 n/cm2 at about 100°C. Effects of oxygen impurities on the formation of irradiation-induced defects and the interaction between the defects and oxygen impurities are studied systematically by combining the positron lifetime and coincidence Doppler broadening (CDB) techniques. It is found that the lifetimes longer than 380 ps are due to positron trapped at irradiation-induced microvoids. From the CDB measurement, the fingerprints of oxygen-impurity decoration of the defects are found in the high momentum region.
|Number of pages||3|
|Journal||Materials Science Forum|
|Publication status||Published - 2001|
|Event||12th International Conference on Positron Annihilation - Munchen, Germany|
Duration: 2000 Aug 6 → 2000 Aug 12
- Coincidence Doppler broadening
- Positron annihilation