Positron annihilation study of microvoids in neutron-irradiated vanadium: Effects of oxygen impurities

T. Riewcharoon; Z. Tang; Y. Nagai; M. Hasegawa

doi:10.4028/www.scientific.net/msf.363-365.167

Positron annihilation study of microvoids in neutron-irradiated vanadium: Effects of oxygen impurities

T. Riewcharoon, Z. Tang, Y. Nagai, M. Hasegawa

IMR - Materials Design Division

Tohoku University

Research output: Contribution to journal › Conference article › peer-review

5 Citations (Scopus)

Abstract

Vanadium samples with controlled oxygen impurity content (6-2460 at.ppm) were irradiated with fast neutrons to a fluence of 8.3×10¹⁸ n/cm² at about 100°C. Effects of oxygen impurities on the formation of irradiation-induced defects and the interaction between the defects and oxygen impurities are studied systematically by combining the positron lifetime and coincidence Doppler broadening (CDB) techniques. It is found that the lifetimes longer than 380 ps are due to positron trapped at irradiation-induced microvoids. From the CDB measurement, the fingerprints of oxygen-impurity decoration of the defects are found in the high momentum region.

Original language	English
Pages (from-to)	167-169
Number of pages	3
Journal	Materials Science Forum
Volume	363-365
DOIs	https://doi.org/10.4028/www.scientific.net/msf.363-365.167
Publication status	Published - 2001
Event	12th International Conference on Positron Annihilation - Munchen, Germany Duration: 2000 Aug 6 → 2000 Aug 12

Keywords

Coincidence Doppler broadening
Microvoids
Positron annihilation
Vanadium

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10.4028/www.scientific.net/msf.363-365.167

Cite this

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title = "Positron annihilation study of microvoids in neutron-irradiated vanadium: Effects of oxygen impurities",

abstract = "Vanadium samples with controlled oxygen impurity content (6-2460 at.ppm) were irradiated with fast neutrons to a fluence of 8.3×1018 n/cm2 at about 100°C. Effects of oxygen impurities on the formation of irradiation-induced defects and the interaction between the defects and oxygen impurities are studied systematically by combining the positron lifetime and coincidence Doppler broadening (CDB) techniques. It is found that the lifetimes longer than 380 ps are due to positron trapped at irradiation-induced microvoids. From the CDB measurement, the fingerprints of oxygen-impurity decoration of the defects are found in the high momentum region.",

keywords = "Coincidence Doppler broadening, Microvoids, Positron annihilation, Vanadium",

author = "T. Riewcharoon and Z. Tang and Y. Nagai and M. Hasegawa",

year = "2001",

doi = "10.4028/www.scientific.net/msf.363-365.167",

language = "English",

volume = "363-365",

pages = "167--169",

journal = "Materials Science Forum",

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note = "12th International Conference on Positron Annihilation ; Conference date: 06-08-2000 Through 12-08-2000",

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TY - JOUR

T1 - Positron annihilation study of microvoids in neutron-irradiated vanadium

T2 - 12th International Conference on Positron Annihilation

AU - Riewcharoon, T.

AU - Tang, Z.

AU - Nagai, Y.

AU - Hasegawa, M.

PY - 2001

Y1 - 2001

N2 - Vanadium samples with controlled oxygen impurity content (6-2460 at.ppm) were irradiated with fast neutrons to a fluence of 8.3×1018 n/cm2 at about 100°C. Effects of oxygen impurities on the formation of irradiation-induced defects and the interaction between the defects and oxygen impurities are studied systematically by combining the positron lifetime and coincidence Doppler broadening (CDB) techniques. It is found that the lifetimes longer than 380 ps are due to positron trapped at irradiation-induced microvoids. From the CDB measurement, the fingerprints of oxygen-impurity decoration of the defects are found in the high momentum region.

AB - Vanadium samples with controlled oxygen impurity content (6-2460 at.ppm) were irradiated with fast neutrons to a fluence of 8.3×1018 n/cm2 at about 100°C. Effects of oxygen impurities on the formation of irradiation-induced defects and the interaction between the defects and oxygen impurities are studied systematically by combining the positron lifetime and coincidence Doppler broadening (CDB) techniques. It is found that the lifetimes longer than 380 ps are due to positron trapped at irradiation-induced microvoids. From the CDB measurement, the fingerprints of oxygen-impurity decoration of the defects are found in the high momentum region.

KW - Coincidence Doppler broadening

KW - Microvoids

KW - Positron annihilation

KW - Vanadium

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AN - SCOPUS:0035024541

SN - 0255-5476

VL - 363-365

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JO - Materials Science Forum

JF - Materials Science Forum

Y2 - 6 August 2000 through 12 August 2000

ER -

Positron annihilation study of microvoids in neutron-irradiated vanadium: Effects of oxygen impurities

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Keywords

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