Precise determination of elastic constants by high-resolution inelastic X-ray scattering

Hiroshi Fukui; Tomoo Katsura; Takahiro Kuribayashi; Takuya Matsuzaki; Akira Yoneda; Eiji Ito; Yasuhiro Kudoh; Satoshi Tsutsui; Alfred Q.R. Baron

doi:10.1107/S0909049508023248

Precise determination of elastic constants by high-resolution inelastic X-ray scattering

Hiroshi Fukui, Tomoo Katsura, Takahiro Kuribayashi, Takuya Matsuzaki, Akira Yoneda, Eiji Ito, Yasuhiro Kudoh, Satoshi Tsutsui, Alfred Q.R. Baron

SCI - Earth Science

Research output: Contribution to journal › Article › peer-review

22 Citations (Scopus)

Abstract

Inelastic X-ray scattering (IXS) measurements have been performed on an MgO single crystal in order to evaluate IXS as a methodology for accurate and precise determination of elastic constants and sound velocities. By performing the IXS experiment using a 12-analyzer array, the complete set of single-crystal elastic constants of MgO were determined to a precision better than 0.8% (sound velocities to better than 0.2%). The results are consistent with values in the literature. The precision and accuracy of this work, which is significantly better than other published work to date, demonstrates the potential of IXS in determining elastic properties.

Original language	English
Pages (from-to)	618-623
Number of pages	6
Journal	Journal of Synchrotron Radiation
Volume	15
Issue number	6
DOIs	https://doi.org/10.1107/S0909049508023248
Publication status	Published - 2008 Oct 3

Keywords

Elastic constants
Inelastic X-ray scattering
MgO
Single crystal
Sound velocity
The Christoffel equation

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10.1107/S0909049508023248

Cite this

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abstract = "Inelastic X-ray scattering (IXS) measurements have been performed on an MgO single crystal in order to evaluate IXS as a methodology for accurate and precise determination of elastic constants and sound velocities. By performing the IXS experiment using a 12-analyzer array, the complete set of single-crystal elastic constants of MgO were determined to a precision better than 0.8% (sound velocities to better than 0.2%). The results are consistent with values in the literature. The precision and accuracy of this work, which is significantly better than other published work to date, demonstrates the potential of IXS in determining elastic properties.",

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author = "Hiroshi Fukui and Tomoo Katsura and Takahiro Kuribayashi and Takuya Matsuzaki and Akira Yoneda and Eiji Ito and Yasuhiro Kudoh and Satoshi Tsutsui and Baron, {Alfred Q.R.}",

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T1 - Precise determination of elastic constants by high-resolution inelastic X-ray scattering

AU - Fukui, Hiroshi

AU - Katsura, Tomoo

AU - Kuribayashi, Takahiro

AU - Matsuzaki, Takuya

AU - Yoneda, Akira

AU - Ito, Eiji

AU - Kudoh, Yasuhiro

AU - Tsutsui, Satoshi

AU - Baron, Alfred Q.R.

PY - 2008/10/3

Y1 - 2008/10/3

N2 - Inelastic X-ray scattering (IXS) measurements have been performed on an MgO single crystal in order to evaluate IXS as a methodology for accurate and precise determination of elastic constants and sound velocities. By performing the IXS experiment using a 12-analyzer array, the complete set of single-crystal elastic constants of MgO were determined to a precision better than 0.8% (sound velocities to better than 0.2%). The results are consistent with values in the literature. The precision and accuracy of this work, which is significantly better than other published work to date, demonstrates the potential of IXS in determining elastic properties.

AB - Inelastic X-ray scattering (IXS) measurements have been performed on an MgO single crystal in order to evaluate IXS as a methodology for accurate and precise determination of elastic constants and sound velocities. By performing the IXS experiment using a 12-analyzer array, the complete set of single-crystal elastic constants of MgO were determined to a precision better than 0.8% (sound velocities to better than 0.2%). The results are consistent with values in the literature. The precision and accuracy of this work, which is significantly better than other published work to date, demonstrates the potential of IXS in determining elastic properties.

KW - Elastic constants

KW - Inelastic X-ray scattering

KW - MgO

KW - Single crystal

KW - Sound velocity

KW - The Christoffel equation

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Precise determination of elastic constants by high-resolution inelastic X-ray scattering

Abstract

Keywords

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