TY - GEN
T1 - Precise estimation of high-dimensional distribution and its application to face recognition
AU - Omachi, Shinichiro
AU - Sun, Fang
AU - Aso, Hirotomo
PY - 2004
Y1 - 2004
N2 - In statistical pattern recognition, it is important to estimate true distribution of patterns precisely to obtain high recognition accuracy. Normal mixtures are sometimes used for representing distributions. However, precise estimation of the parameters of normal mixtures requires a great number of sample patterns, especially for high dimensional vectors. For some pattern recognition problems, such as face recognition, very high dimensional feature vectors are necessary and there are always not enough training samples compared with the dimensionality. We present a method to estimate the distributions based on normal mixtures with small number of samples. The proposed algorithm is applied to face recognition problem which requires high dimensional feature vectors. Experimental results show the effectiveness of the proposed algorithm.
AB - In statistical pattern recognition, it is important to estimate true distribution of patterns precisely to obtain high recognition accuracy. Normal mixtures are sometimes used for representing distributions. However, precise estimation of the parameters of normal mixtures requires a great number of sample patterns, especially for high dimensional vectors. For some pattern recognition problems, such as face recognition, very high dimensional feature vectors are necessary and there are always not enough training samples compared with the dimensionality. We present a method to estimate the distributions based on normal mixtures with small number of samples. The proposed algorithm is applied to face recognition problem which requires high dimensional feature vectors. Experimental results show the effectiveness of the proposed algorithm.
UR - http://www.scopus.com/inward/record.url?scp=10044264142&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=10044264142&partnerID=8YFLogxK
U2 - 10.1109/ICPR.2004.1334063
DO - 10.1109/ICPR.2004.1334063
M3 - Conference contribution
AN - SCOPUS:10044264142
SN - 0769521282
T3 - Proceedings - International Conference on Pattern Recognition
SP - 220
EP - 223
BT - Proceedings of the 17th International Conference on Pattern Recognition, ICPR 2004
A2 - Kittler, J.
A2 - Petrou, M.
A2 - Nixon, M.
T2 - Proceedings of the 17th International Conference on Pattern Recognition, ICPR 2004
Y2 - 23 August 2004 through 26 August 2004
ER -