Abstract
A highly precise measurement method of LC material parameters was proposed. By application of new driving scheme of LC in the capacitance measurement, and compensation for the capacitance of alignment layer and the anchoring strength of LC cell, we obtained reliable measurement values using the numerical fitting method on the capacitance-voltage property of LC cell.
| Original language | English |
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| Pages | 23-24 |
| Number of pages | 2 |
| Publication status | Published - 2008 Dec 1 |
| Event | 15th International Display Workshops, IDW '08 - Niigata, Japan Duration: 2008 Dec 3 → 2008 Dec 5 |
Other
| Other | 15th International Display Workshops, IDW '08 |
|---|---|
| Country/Territory | Japan |
| City | Niigata |
| Period | 08/12/3 → 08/12/5 |
ASJC Scopus subject areas
- Hardware and Architecture
- Human-Computer Interaction
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials